Infrared near-field microscopy with the Vanderbilt free electron laser: Overview and perspectives

D. Vobornik; G. Margaritondo; J. S. Sanghera; P. Thielen; I. D. Aggarwal; B. Ivanov; J. K. Miller; R. Haglund; N. H. Tolk; A. Congiu-Castellano; M. A. Rizzo; D. W. Piston; F. Somma; G. Baldacchini; F. Bonfigli; T. Marolo; F. Flora; R. M. Montereali; A. Faenov; T. Pikuz; G. Longo; V. Mussi; R. Generosi; M. Luce; P. Perfetti; A. Cricenti

doi:10.1016/j.infrared.2004.01.007

Infrared near-field microscopy with the Vanderbilt free electron laser: Overview and perspectives

D. Vobornik
, G. Margaritondo
, J. S. Sanghera
, P. Thielen
, I. D. Aggarwal
, B. Ivanov
, J. K. Miller
, R. Haglund
, N. H. Tolk
, A. Congiu-Castellano
, M. A. Rizzo
, D. W. Piston
, F. Somma
, G. Baldacchini
, F. Bonfigli
, T. Marolo
, F. Flora
, R. M. Montereali
, A. Faenov
, T. Pikuz

G. Longo, V. Mussi, R. Generosi, M. Luce, P. Perfetti, A. Cricenti

Research output: Contribution to journal › Conference article › peer-review

12 Scopus citations

Abstract

Scanning near-field optical microscopy (SNOM) makes it routinely possible to overcome the fundamental diffraction limit of standard (far-field) microscopy. Recently, aperture-based infrared SNOM performed in the spectroscopic mode, using the Vanderbilt University free electron laser, started delivering spatially-resolved information on the distribution of chemical species and on other laterally-fluctuating properties. The practical examples presented here show the great potential of this new technique both in materials science and in life sciences.

Original language	English
Pages (from-to)	409-416
Number of pages	8
Journal	Infrared Physics and Technology
Volume	45
Issue number	5-6
DOIs	https://doi.org/10.1016/j.infrared.2004.01.007
State	Published - Oct 2004
Event	International Workshop on Infrared Microscopy and Spectroscopy - Lake Tahoe, CA, United States Duration: Jul 8 2003 → Aug 11 2003

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10.1016/j.infrared.2004.01.007

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Vobornik, D., Margaritondo, G., Sanghera, J. S., Thielen, P., Aggarwal, I. D., Ivanov, B., Miller, J. K., Haglund, R., Tolk, N. H., Congiu-Castellano, A., Rizzo, M. A., Piston, D. W., Somma, F., Baldacchini, G., Bonfigli, F., Marolo, T., Flora, F., Montereali, R. M., Faenov, A., ... Cricenti, A. (2004). Infrared near-field microscopy with the Vanderbilt free electron laser: Overview and perspectives. Infrared Physics and Technology, 45(5-6), 409-416. https://doi.org/10.1016/j.infrared.2004.01.007

@article{914cd4ff8ae04a5e85f2060631a6d121,

title = "Infrared near-field microscopy with the Vanderbilt free electron laser: Overview and perspectives",

abstract = "Scanning near-field optical microscopy (SNOM) makes it routinely possible to overcome the fundamental diffraction limit of standard (far-field) microscopy. Recently, aperture-based infrared SNOM performed in the spectroscopic mode, using the Vanderbilt University free electron laser, started delivering spatially-resolved information on the distribution of chemical species and on other laterally-fluctuating properties. The practical examples presented here show the great potential of this new technique both in materials science and in life sciences.",

author = "D. Vobornik and G. Margaritondo and Sanghera, \{J. S.\} and P. Thielen and Aggarwal, \{I. D.\} and B. Ivanov and Miller, \{J. K.\} and R. Haglund and Tolk, \{N. H.\} and A. Congiu-Castellano and Rizzo, \{M. A.\} and Piston, \{D. W.\} and F. Somma and G. Baldacchini and F. Bonfigli and T. Marolo and F. Flora and Montereali, \{R. M.\} and A. Faenov and T. Pikuz and G. Longo and V. Mussi and R. Generosi and M. Luce and P. Perfetti and A. Cricenti",

year = "2004",

month = oct,

doi = "10.1016/j.infrared.2004.01.007",

language = "English",

volume = "45",

pages = "409--416",

journal = "Infrared Physics and Technology",

issn = "1350-4495",

number = "5-6",

note = "International Workshop on Infrared Microscopy and Spectroscopy ; Conference date: 08-07-2003 Through 11-08-2003",

}

Vobornik, D, Margaritondo, G, Sanghera, JS, Thielen, P, Aggarwal, ID, Ivanov, B, Miller, JK, Haglund, R, Tolk, NH, Congiu-Castellano, A, Rizzo, MA, Piston, DW, Somma, F, Baldacchini, G, Bonfigli, F, Marolo, T, Flora, F, Montereali, RM, Faenov, A, Pikuz, T, Longo, G, Mussi, V, Generosi, R, Luce, M, Perfetti, P & Cricenti, A 2004, 'Infrared near-field microscopy with the Vanderbilt free electron laser: Overview and perspectives', Infrared Physics and Technology, vol. 45, no. 5-6, pp. 409-416. https://doi.org/10.1016/j.infrared.2004.01.007

TY - JOUR

T1 - Infrared near-field microscopy with the Vanderbilt free electron laser

T2 - International Workshop on Infrared Microscopy and Spectroscopy

AU - Vobornik, D.

AU - Margaritondo, G.

AU - Sanghera, J. S.

AU - Thielen, P.

AU - Aggarwal, I. D.

AU - Ivanov, B.

AU - Miller, J. K.

AU - Haglund, R.

AU - Tolk, N. H.

AU - Congiu-Castellano, A.

AU - Rizzo, M. A.

AU - Piston, D. W.

AU - Somma, F.

AU - Baldacchini, G.

AU - Bonfigli, F.

AU - Marolo, T.

AU - Flora, F.

AU - Montereali, R. M.

AU - Faenov, A.

AU - Pikuz, T.

AU - Longo, G.

AU - Mussi, V.

AU - Generosi, R.

AU - Luce, M.

AU - Perfetti, P.

AU - Cricenti, A.

PY - 2004/10

Y1 - 2004/10

N2 - Scanning near-field optical microscopy (SNOM) makes it routinely possible to overcome the fundamental diffraction limit of standard (far-field) microscopy. Recently, aperture-based infrared SNOM performed in the spectroscopic mode, using the Vanderbilt University free electron laser, started delivering spatially-resolved information on the distribution of chemical species and on other laterally-fluctuating properties. The practical examples presented here show the great potential of this new technique both in materials science and in life sciences.

AB - Scanning near-field optical microscopy (SNOM) makes it routinely possible to overcome the fundamental diffraction limit of standard (far-field) microscopy. Recently, aperture-based infrared SNOM performed in the spectroscopic mode, using the Vanderbilt University free electron laser, started delivering spatially-resolved information on the distribution of chemical species and on other laterally-fluctuating properties. The practical examples presented here show the great potential of this new technique both in materials science and in life sciences.

UR - https://www.scopus.com/pages/publications/3342934943

U2 - 10.1016/j.infrared.2004.01.007

DO - 10.1016/j.infrared.2004.01.007

M3 - Conference article

AN - SCOPUS:3342934943

SN - 1350-4495

VL - 45

SP - 409

EP - 416

JO - Infrared Physics and Technology

JF - Infrared Physics and Technology

IS - 5-6

Y2 - 8 July 2003 through 11 August 2003

ER -

Infrared near-field microscopy with the Vanderbilt free electron laser: Overview and perspectives

Abstract

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