Use of High Lateral Resolution Secondary Ion Mass Spectrometry To Characterize Self-Assembled Monolayers on Microfabricated Structures

  • C. Daniel Frisbie
  • , John R. Martin
  • , Ronald R. Duff
  • , Mark S. Wrighton

Research output: Contribution to journal › Article › peer-review

47 Scopus citations

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Physics

Engineering

Earth and Planetary Sciences

Chemistry