The goodness of simultaneous fits in ISIS

Matthias Kühnel; Sebastian Falkner; Christoph Grossberger; Ralf Ballhausen; Thomas Dauser; Fritz Walter Schwarm; Ingo Kreykenbohm; Michael A. Nowak; Katja Pottschmidt; Carlo Ferrigno; Richard E. Rothschild; Silvia Martínez-Núñez; José Miguel Torrejón; Felix Fürst; Dmitry Klochkov; Rüdiger Staubert; Peter Kretschmar; Jörn Wilms

doi:10.14311/APP.2016.56.0041

The goodness of simultaneous fits in ISIS

Matthias Kühnel
, Sebastian Falkner
, Christoph Grossberger
, Ralf Ballhausen
, Thomas Dauser
, Fritz Walter Schwarm
, Ingo Kreykenbohm
, Michael A. Nowak
, Katja Pottschmidt
, Carlo Ferrigno
, Richard E. Rothschild
, Silvia Martínez-Núñez
, José Miguel Torrejón
, Felix Fürst
, Dmitry Klochkov
, Rüdiger Staubert
, Peter Kretschmar
, Jörn Wilms

Department of Physics

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

In a previous work, we introduced a tool for analyzing multiple datasets simultaneously, which has been implemented into ISIS. This tool was used to fit many spectra of X-ray binaries. However, the large number of degrees of freedom and individual datasets raise an issue about a good measure for a simultaneous fit quality. We present three ways to check the goodness of these fits: we investigate the goodness of each fit in all datasets, we define a combined goodness exploiting the logical structure of a simultaneous fit, and we stack the fit residuals of all datasets to detect weak features. These tools are applied to all RXTE-spectra from GRO 1008−57, revealing calibration features that are not detected significantly in any single spectrum. Stacking the residuals from the best-fit model for the Vela X-1 and XTE J1859+083 data evidences fluorescent emission lines that would have gone undetected otherwise.

Original language	English
Pages (from-to)	41-46
Number of pages	6
Journal	Acta Polytechnica
Volume	56
Issue number	1
DOIs	https://doi.org/10.14311/APP.2016.56.0041
State	Published - 2016

Keywords

Data analysis
Multiple datasets
X-rays binaries

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10.14311/APP.2016.56.0041

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Kühnel, M., Falkner, S., Grossberger, C., Ballhausen, R., Dauser, T., Schwarm, F. W., Kreykenbohm, I., Nowak, M. A., Pottschmidt, K., Ferrigno, C., Rothschild, R. E., Martínez-Núñez, S., Torrejón, J. M., Fürst, F., Klochkov, D., Staubert, R., Kretschmar, P., & Wilms, J. (2016). The goodness of simultaneous fits in ISIS. Acta Polytechnica, 56(1), 41-46. https://doi.org/10.14311/APP.2016.56.0041

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title = "The goodness of simultaneous fits in ISIS",

abstract = "In a previous work, we introduced a tool for analyzing multiple datasets simultaneously, which has been implemented into ISIS. This tool was used to fit many spectra of X-ray binaries. However, the large number of degrees of freedom and individual datasets raise an issue about a good measure for a simultaneous fit quality. We present three ways to check the goodness of these fits: we investigate the goodness of each fit in all datasets, we define a combined goodness exploiting the logical structure of a simultaneous fit, and we stack the fit residuals of all datasets to detect weak features. These tools are applied to all RXTE-spectra from GRO 1008−57, revealing calibration features that are not detected significantly in any single spectrum. Stacking the residuals from the best-fit model for the Vela X-1 and XTE J1859+083 data evidences fluorescent emission lines that would have gone undetected otherwise.",

keywords = "Data analysis, Multiple datasets, X-rays binaries",

author = "Matthias K{\"u}hnel and Sebastian Falkner and Christoph Grossberger and Ralf Ballhausen and Thomas Dauser and Schwarm, \{Fritz Walter\} and Ingo Kreykenbohm and Nowak, \{Michael A.\} and Katja Pottschmidt and Carlo Ferrigno and Rothschild, \{Richard E.\} and Silvia Mart{\'i}nez-N{\'u}{\~n}ez and Torrej{\'o}n, \{Jos{\'e} Miguel\} and Felix F{\"u}rst and Dmitry Klochkov and R{\"u}diger Staubert and Peter Kretschmar and J{\"o}rn Wilms",

note = "Publisher Copyright: {\textcopyright} Czech Technical University in Prague, 2016.",

year = "2016",

doi = "10.14311/APP.2016.56.0041",

language = "English",

volume = "56",

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journal = "Acta Polytechnica",

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Kühnel, M, Falkner, S, Grossberger, C, Ballhausen, R, Dauser, T, Schwarm, FW, Kreykenbohm, I, Nowak, MA, Pottschmidt, K, Ferrigno, C, Rothschild, RE, Martínez-Núñez, S, Torrejón, JM, Fürst, F, Klochkov, D, Staubert, R, Kretschmar, P & Wilms, J 2016, 'The goodness of simultaneous fits in ISIS', Acta Polytechnica, vol. 56, no. 1, pp. 41-46. https://doi.org/10.14311/APP.2016.56.0041

TY - JOUR

T1 - The goodness of simultaneous fits in ISIS

AU - Kühnel, Matthias

AU - Falkner, Sebastian

AU - Grossberger, Christoph

AU - Ballhausen, Ralf

AU - Dauser, Thomas

AU - Schwarm, Fritz Walter

AU - Kreykenbohm, Ingo

AU - Nowak, Michael A.

AU - Pottschmidt, Katja

AU - Ferrigno, Carlo

AU - Rothschild, Richard E.

AU - Martínez-Núñez, Silvia

AU - Torrejón, José Miguel

AU - Fürst, Felix

AU - Klochkov, Dmitry

AU - Staubert, Rüdiger

AU - Kretschmar, Peter

AU - Wilms, Jörn

PY - 2016

Y1 - 2016

N2 - In a previous work, we introduced a tool for analyzing multiple datasets simultaneously, which has been implemented into ISIS. This tool was used to fit many spectra of X-ray binaries. However, the large number of degrees of freedom and individual datasets raise an issue about a good measure for a simultaneous fit quality. We present three ways to check the goodness of these fits: we investigate the goodness of each fit in all datasets, we define a combined goodness exploiting the logical structure of a simultaneous fit, and we stack the fit residuals of all datasets to detect weak features. These tools are applied to all RXTE-spectra from GRO 1008−57, revealing calibration features that are not detected significantly in any single spectrum. Stacking the residuals from the best-fit model for the Vela X-1 and XTE J1859+083 data evidences fluorescent emission lines that would have gone undetected otherwise.

AB - In a previous work, we introduced a tool for analyzing multiple datasets simultaneously, which has been implemented into ISIS. This tool was used to fit many spectra of X-ray binaries. However, the large number of degrees of freedom and individual datasets raise an issue about a good measure for a simultaneous fit quality. We present three ways to check the goodness of these fits: we investigate the goodness of each fit in all datasets, we define a combined goodness exploiting the logical structure of a simultaneous fit, and we stack the fit residuals of all datasets to detect weak features. These tools are applied to all RXTE-spectra from GRO 1008−57, revealing calibration features that are not detected significantly in any single spectrum. Stacking the residuals from the best-fit model for the Vela X-1 and XTE J1859+083 data evidences fluorescent emission lines that would have gone undetected otherwise.

KW - Data analysis

KW - Multiple datasets

KW - X-rays binaries

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DO - 10.14311/APP.2016.56.0041

M3 - Article

AN - SCOPUS:84959313293

SN - 1210-2709

VL - 56

SP - 41

EP - 46

JO - Acta Polytechnica

JF - Acta Polytechnica

IS - 1

ER -

The goodness of simultaneous fits in ISIS

Abstract

Keywords

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