Study of textured n-type silicon photoanodes: Electron microscopy, auger and electroanalytical characterization of chemically derivatized surfaces

Keyphrases

• AuGe 100%
• Surface Texture 100%
• Electron Microscopy Characterization 100%
• Silicon Photoanode 100%
• Electroanalytical Characterization 100%
• Si Surface 50%
• Polished Surface 50%
• Cell-based 25%
• Electron Microscopy 25%
• Overall Efficiency 25%
• Single Crystal 25%
• (100) Surfaces 25%
• Electrochemical Techniques 25%
• Auger Electron Spectroscopy 25%
• Ferrocene 25%
• Electroactive 25%
• Photoelectrochemical Cell 25%
• Surface-confined 25%
• N-Si 25%
• Dimethylsilane 25%
• Low Reflection 25%
• Electroactive Materials 25%
• Reflection Loss 25%
• Photoelectrochemical Devices 25%
• Photoanode Materials 25%
• Reduction Peak 25%

Material Science

• Electron Microscopy 100%
• Silicon 100%
• Surface (Surface Science) 100%
• Electrochemical Reaction 10%
• Photoelectrochemical Cell 10%
• Single Crystal 10%

Engineering

• Textured Surface 100%
• Si Surface 66%
• Photoelectrochemical Cell 33%
• Electrochemical Technique 33%
• Reflection Loss 33%