Abstract
A comparision of the temperature dependence of the vibrational lifetime of two structuraly distinct point defects in crystalline silicon, H2*, and intersitial defect, and HV . VH110, a vaccancy complex was reported. Different temperature dependences showed that these vibrationaly excited defects decay into different accepting vibrational modes. The temperature dependence of the lifetime of H2* was due to by TA phonons, while HV . VH110 was governed by LA phonons. The behavior was explained in terms of distinctly different local structure of these defects and the accompanying local vibrational modes.
Original language | English |
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Article number | 135501 |
Pages (from-to) | 1355011-1355014 |
Number of pages | 4 |
Journal | Physical Review Letters |
Volume | 88 |
Issue number | 13 |
State | Published - Apr 1 2002 |