TY - JOUR
T1 - Structural characterization of phosphide and related semiconductor nanoclusters
AU - Viano, A. M.
AU - Gibbons, P. C.
AU - Buhro, W. E.
AU - Goel, S. C.
AU - Matchett, M. A.
PY - 1993
Y1 - 1993
N2 - Semiconductor nanoclusters of InP, Cd3P2, and CdS have been synthesized and analyzed to determine size distribution, composition, and core crystallinity. Transmission electron microscope (TEM) images show particles whose size distribution can be measured using manual and computer-automated techniques. Diffraction and high-resolution imaging have been used to study core crystallinity. Crystalline Cd3P2, CdS and amorphous Cd3P2, InP, and CdS nanoparticles in the 1 nm - 10 nm size range have been obtained.
AB - Semiconductor nanoclusters of InP, Cd3P2, and CdS have been synthesized and analyzed to determine size distribution, composition, and core crystallinity. Transmission electron microscope (TEM) images show particles whose size distribution can be measured using manual and computer-automated techniques. Diffraction and high-resolution imaging have been used to study core crystallinity. Crystalline Cd3P2, CdS and amorphous Cd3P2, InP, and CdS nanoparticles in the 1 nm - 10 nm size range have been obtained.
UR - https://www.scopus.com/pages/publications/43949175857
U2 - 10.1016/0965-9773(93)90085-P
DO - 10.1016/0965-9773(93)90085-P
M3 - Article
AN - SCOPUS:43949175857
SN - 0965-9773
VL - 3
SP - 239
EP - 244
JO - Nanostructured Materials
JF - Nanostructured Materials
IS - 1-6
ER -