Structural characterization of phosphide and related semiconductor nanoclusters

A. M. Viano; P. C. Gibbons; W. E. Buhro; S. C. Goel; M. A. Matchett

doi:10.1016/0965-9773(93)90085-P

Structural characterization of phosphide and related semiconductor nanoclusters

A. M. Viano
, P. C. Gibbons
, W. E. Buhro
, S. C. Goel
, M. A. Matchett

Research output: Contribution to journal › Article › peer-review

Abstract

Semiconductor nanoclusters of InP, Cd₃P₂, and CdS have been synthesized and analyzed to determine size distribution, composition, and core crystallinity. Transmission electron microscope (TEM) images show particles whose size distribution can be measured using manual and computer-automated techniques. Diffraction and high-resolution imaging have been used to study core crystallinity. Crystalline Cd₃P₂, CdS and amorphous Cd₃P₂, InP, and CdS nanoparticles in the 1 nm - 10 nm size range have been obtained.

Original language	English
Pages (from-to)	239-244
Number of pages	6
Journal	Nanostructured Materials
Volume	3
Issue number	1-6
DOIs	https://doi.org/10.1016/0965-9773(93)90085-P
State	Published - 1993

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title = "Structural characterization of phosphide and related semiconductor nanoclusters",

abstract = "Semiconductor nanoclusters of InP, Cd3P2, and CdS have been synthesized and analyzed to determine size distribution, composition, and core crystallinity. Transmission electron microscope (TEM) images show particles whose size distribution can be measured using manual and computer-automated techniques. Diffraction and high-resolution imaging have been used to study core crystallinity. Crystalline Cd3P2, CdS and amorphous Cd3P2, InP, and CdS nanoparticles in the 1 nm - 10 nm size range have been obtained.",

author = "Viano, \{A. M.\} and Gibbons, \{P. C.\} and Buhro, \{W. E.\} and Goel, \{S. C.\} and Matchett, \{M. A.\}",

year = "1993",

doi = "10.1016/0965-9773(93)90085-P",

language = "English",

volume = "3",

pages = "239--244",

journal = "Nanostructured Materials",

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TY - JOUR

T1 - Structural characterization of phosphide and related semiconductor nanoclusters

AU - Viano, A. M.

AU - Gibbons, P. C.

AU - Buhro, W. E.

AU - Goel, S. C.

AU - Matchett, M. A.

PY - 1993

Y1 - 1993

N2 - Semiconductor nanoclusters of InP, Cd3P2, and CdS have been synthesized and analyzed to determine size distribution, composition, and core crystallinity. Transmission electron microscope (TEM) images show particles whose size distribution can be measured using manual and computer-automated techniques. Diffraction and high-resolution imaging have been used to study core crystallinity. Crystalline Cd3P2, CdS and amorphous Cd3P2, InP, and CdS nanoparticles in the 1 nm - 10 nm size range have been obtained.

AB - Semiconductor nanoclusters of InP, Cd3P2, and CdS have been synthesized and analyzed to determine size distribution, composition, and core crystallinity. Transmission electron microscope (TEM) images show particles whose size distribution can be measured using manual and computer-automated techniques. Diffraction and high-resolution imaging have been used to study core crystallinity. Crystalline Cd3P2, CdS and amorphous Cd3P2, InP, and CdS nanoparticles in the 1 nm - 10 nm size range have been obtained.

UR - https://www.scopus.com/pages/publications/43949175857

U2 - 10.1016/0965-9773(93)90085-P

DO - 10.1016/0965-9773(93)90085-P

M3 - Article

AN - SCOPUS:43949175857

SN - 0965-9773

VL - 3

SP - 239

EP - 244

JO - Nanostructured Materials

JF - Nanostructured Materials

IS - 1-6

ER -

Structural characterization of phosphide and related semiconductor nanoclusters

Abstract

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