Stress Analysis of Porous Rooted Dental Implants

Allan M. Weinstein, Jerome J. Klawitter, Subhash C. Anand, Richard Schuessler

Research output: Contribution to journalArticle

61 Scopus citations

Abstract

A two-dimensional plane stress finite element analysis of porous rooted dental implants was performed. The results of this analysis were compared to results obtained from mechanical tests performed on actual implanted specimens. The appropriate selection of interface material properties was shown to be highly significant.

Original languageEnglish
Pages (from-to)772-777
Number of pages6
JournalJournal of Dental Research
Volume55
Issue number5
DOIs
StatePublished - Sep 1976
Externally publishedYes

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