Spectroscopic infrared scanning near-field optical microscopy (IR-SNOM)

D. Vobornik, G. Margaritondo, J. S. Sanghera, P. Thielen, I. D. Aggarwal, B. Ivanov, N. H. Tolk, V. Manni, S. Grimaldi, A. Lisi, S. Rieti, D. W. Piston, R. Generosi, M. Luce, P. Perfetti, A. Cricenti

Research output: Contribution to journalConference articlepeer-review

23 Scopus citations

Abstract

Scanning near-field optical microscopy (SNOM or NSOM) is the technique with the highest lateral optical resolution available today, while infrared (IR) spectroscopy has a high chemical specificity. Combining SNOM with a tunable IR source produces a unique tool, IR-SNOM, capable of imaging distributions of chemical species with a 100 nm spatial resolution. We present in this paper boron nitride (BN) thin film images, where IR-SNOM shows the distribution of hexagonal and cubic phases within the sample. Exciting potential applications in biophysics and medical sciences are illustrated with SNOM images of the distribution of different chemical species within cells. We present in this article images with resolutions of the order of λ/60 with SNOM working with infrared light. With our SNOM setup, we routinely get optical resolutions between 50 and 150 nm, regardless of the wavelength of the light used to illuminate the sample.

Original languageEnglish
Pages (from-to)80-85
Number of pages6
JournalJournal of Alloys and Compounds
Volume401
Issue number1-2
DOIs
StatePublished - Sep 29 2005
Externally publishedYes

Keywords

  • BN
  • Cells
  • Infrared spectroscopy
  • NSOM
  • SNOM
  • Thin film

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