Sigma-delta learning for super-resolution independent component analysis

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Many source separation algorithms fail to deliver robust performance in presence of artifacts introduced by cross-channel redundancy, non-homogeneous mixing and high-dimensionality of the input signal space. In this paper, we propose a novel framework that overcomes these limitations by integrating learning algorithms directly with the process of signal acquisition and sampling. At the core of the proposed approach is a novel regularized max-min optimization approach that yields "sigma-delta" limit-cycles. An on-line adaptation modulates the limit-cycles to enhance resolution in the signal subspaces containing non-redundant information. Numerical experiments simulating near-singular and non-homogeneous recording conditions demonstrate consistent improvements of the proposed algorithm over a benchmark when applied for independent component analysis (ICA).

Original languageEnglish
Title of host publication2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
Pages2997-3000
Number of pages4
DOIs
StatePublished - 2008
Event2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008 - Seattle, WA, United States
Duration: May 18 2008May 21 2008

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Conference

Conference2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
Country/TerritoryUnited States
CitySeattle, WA
Period05/18/0805/21/08

Fingerprint

Dive into the research topics of 'Sigma-delta learning for super-resolution independent component analysis'. Together they form a unique fingerprint.

Cite this