TY - GEN
T1 - Self-powered sensing and time-stamping of tampering events
AU - Mehta, Darshit
AU - Zhou, Liang
AU - Aono, Kenji
AU - Chakrabartty, Shantanu
N1 - Funding Information:
This work was supported in part by the National Science Foundation under Grant ECCS-1550096,CNS-1646380, DGE-0802267 and DGE-1143954.
Publisher Copyright:
© 2018 IEEE
PY - 2018/7/2
Y1 - 2018/7/2
N2 - While many techniques exist for detecting mechanical tampering in an integrated circuit supply-chain, estimating the time-of-occurrence of the tampering event has proven to be challenging. This work builds upon our previously demonstrated self-powered mechanical event detector and self-powered timing device to report a chip-scale system that can accurately time-stamp the occurrence of the tampering event. The proposed system uses a combination of Fowler-Nordheim tunneling for continuous time-keeping and a linear hot-electron injector for sensing and recording of mechanical events. Using devices fabricated in a 0.5 µ-m standard CMOS process, we demonstrate event time-stamping with an accuracy of 95% over a duration of 3 days. This accuracy can be further improved by incorporating a parametric model during the system calibration phase.
AB - While many techniques exist for detecting mechanical tampering in an integrated circuit supply-chain, estimating the time-of-occurrence of the tampering event has proven to be challenging. This work builds upon our previously demonstrated self-powered mechanical event detector and self-powered timing device to report a chip-scale system that can accurately time-stamp the occurrence of the tampering event. The proposed system uses a combination of Fowler-Nordheim tunneling for continuous time-keeping and a linear hot-electron injector for sensing and recording of mechanical events. Using devices fabricated in a 0.5 µ-m standard CMOS process, we demonstrate event time-stamping with an accuracy of 95% over a duration of 3 days. This accuracy can be further improved by incorporating a parametric model during the system calibration phase.
UR - http://www.scopus.com/inward/record.url?scp=85062217169&partnerID=8YFLogxK
U2 - 10.1109/MWSCAS.2018.8623916
DO - 10.1109/MWSCAS.2018.8623916
M3 - Conference contribution
AN - SCOPUS:85062217169
T3 - Midwest Symposium on Circuits and Systems
SP - 968
EP - 971
BT - 2018 IEEE 61st International Midwest Symposium on Circuits and Systems, MWSCAS 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 61st IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2018
Y2 - 5 August 2018 through 8 August 2018
ER -