Sat2Cap: Mapping Fine-Grained Textual Descriptions from Satellite Images

Aayush Dhakal, Adeel Ahmad, Subash Khanal, Srikumar Sastry, Hannah Kerner, Nathan Jacobs

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

We propose a weakly supervised approach for creating maps using free-form textual descriptions. We refer to this work of creating textual maps as zero-shot mapping. Prior works have approached mapping tasks by developing models that predict a fixed set of attributes using overhead imagery. However, these models are very restrictive as they can only solve highly specific tasks for which they were trained. Mapping text, on the other hand, allows us to solve a large variety of mapping problems with minimal restrictions. To achieve this, we train a contrastive learning framework called Sat2Cap on a new large-scale dataset with 6.1M pairs of overhead and ground-level images. For a given location and overhead image, our model predicts the expected CLIP embeddings of the ground-level scenery. The predicted CLIP embeddings are then used to learn about the textual space associated with that location. Sat2Cap is also conditioned on date-time information, allowing it to model temporally varying concepts over a location. Our experimental results demonstrate that our models successfully capture ground-level concepts and allow large-scale mapping of fine-grained textual queries. Our approach does not require any text-labeled data, making the training easily scalable. The code, dataset, and models will be made publicly available.

Original languageEnglish
Title of host publicationProceedings - 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024
PublisherIEEE Computer Society
Pages533-542
Number of pages10
ISBN (Electronic)9798350365474
DOIs
StatePublished - 2024
Event2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024 - Seattle, United States
Duration: Jun 16 2024Jun 22 2024

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024
Country/TerritoryUnited States
CitySeattle
Period06/16/2406/22/24

Keywords

  • Contrastive Learning
  • Text-based Mapping
  • Vision-Language Model

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