TY - GEN
T1 - Return-to-Non-Secure Vulnerabilities on ARM Cortex-M TrustZone
T2 - 60th ACM/IEEE Design Automation Conference, DAC 2023
AU - Ma, Zheyuan
AU - Tan, Xi
AU - Ziarek, Lukasz
AU - Zhang, Ning
AU - Hu, Hongxin
AU - Zhao, Ziming
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - ARM Cortex-M is one of the most popular microcontroller architectures designed for embedded and Internet of Things (IoT) applications. To facilitate efficient execution, it has some unique hardware optimization. In particular, Cortex-M TrustZone has a fast state switch mechanism that allows direct control-flow transfer from the secure state program to the non-secure state userspace program. In this paper, we demonstrate how this fast state switch mechanism can be exploited for arbitrary code execution with escalated privilege in the non-secure state by introducing a new exploitation technique, namely return-to-non-secure (ret2ns). We experimentally confirmed the feasibility of four variants of ret2ns attacks on two Cortex-M hardware systems. To defend against ret2ns attacks, we design two address sanitizing mechanisms that have negligible performance overhead.
AB - ARM Cortex-M is one of the most popular microcontroller architectures designed for embedded and Internet of Things (IoT) applications. To facilitate efficient execution, it has some unique hardware optimization. In particular, Cortex-M TrustZone has a fast state switch mechanism that allows direct control-flow transfer from the secure state program to the non-secure state userspace program. In this paper, we demonstrate how this fast state switch mechanism can be exploited for arbitrary code execution with escalated privilege in the non-secure state by introducing a new exploitation technique, namely return-to-non-secure (ret2ns). We experimentally confirmed the feasibility of four variants of ret2ns attacks on two Cortex-M hardware systems. To defend against ret2ns attacks, we design two address sanitizing mechanisms that have negligible performance overhead.
UR - https://www.scopus.com/pages/publications/85173067713
U2 - 10.1109/DAC56929.2023.10247972
DO - 10.1109/DAC56929.2023.10247972
M3 - Conference contribution
AN - SCOPUS:85173067713
T3 - Proceedings - Design Automation Conference
BT - 2023 60th ACM/IEEE Design Automation Conference, DAC 2023
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 9 July 2023 through 13 July 2023
ER -