222 Scopus citations

Abstract

The development of atomic force microscopy has evolved into a wide variety of microscopy and characterization techniques well beyond conventional imaging. The focus of this review is on characterization methods based on the scanning probe and their application in characterizing physical properties of soft materials. This consideration is broken into three major categories focusing on mechanical, thermal, and electrical/magnetic properties in addition to a brief review of high-resolution imaging. Surface spectroscopy is discussed to great extent and consideration includes procedural information, common pitfalls, capabilities, and their practical application in characterizing soft matter. Key examples of the method are presented to communicate the capabilities and impact that probe-based characterization techniques have had on the mechanical, thermal, and electrical characterization of soft materials.

Original languageEnglish
Pages (from-to)235-286
Number of pages52
JournalPolymer Reviews
Volume50
Issue number3
DOIs
StatePublished - Jul 2010

Keywords

  • atomic force microscopy
  • force spectroscopy
  • kelvin probe force microscopy
  • polymers
  • scanning probe microscopy
  • scanning thermal microscopy

Fingerprint

Dive into the research topics of 'Probing soft matter with the atomic force microscopies: Imaging and force spectroscopy'. Together they form a unique fingerprint.

Cite this