Phenotyping Complex Plant Structures with a Large Format Industrial Scale High-Resolution X-Ray Tomography Instrument

Keith E. Duncan, Christopher N. Topp

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

1 Scopus citations

Abstract

Phenotyping specific plant traits is difficult when the samples to be measured are architecturally complex. Inflorescence and root system traits are of great biological interest, but these structures present unique phenotyping challenges due to their often complicated and three-dimensional (3D) forms. We describe how a large industrial scale X-ray tomography (XRT) instrument can be used to scan architecturally complex plant structures for the goal of rapid and accurate measurement of traits that are otherwise cumbersome or not possible to capture by other means. The combination of a large imaging cabinet that can accommodate a wide range of sample size geometries and a variable microfocus reflection X-ray source allows noninvasive X-ray imaging and 3D volume generation of diverse sample types. Specific sample fixturing (mounting) and scanning conditions are presented. These techniques can be moderate to high throughput and still provide unprecedented levels of accuracy and information content in the 3D volume data they generate.

Original languageEnglish
Title of host publicationMethods in Molecular Biology
PublisherHumana Press Inc.
Pages119-132
Number of pages14
DOIs
StatePublished - 2022

Publication series

NameMethods in Molecular Biology
Volume2539
ISSN (Print)1064-3745
ISSN (Electronic)1940-6029

Keywords

  • Excavated root system
  • Inflorescence
  • Panicle
  • Phenotyping
  • X-ray tomography

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