Optimizing Optical Parameters to Facilitate Correlation of Laser-and Heavy-Ion-Induced Single-Event Transients in SiGe HBTs

Adrian Ildefonso, Zachary E. Fleetwood, George N. Tzintzarov, Joel M. Hales, Delgermaa Nergui, Milad Frounchi, Ani Khachatrian, Stephen P. Buchner, Dale McMorrow, Jeffrey H. Warner, Joseph Harms, Anna Erickson, Kay Voss, Veronique Ferlet-Cavrois, John D. Cressler

Research output: Contribution to journalArticlepeer-review

24 Scopus citations

Abstract

An approach for determining the optimal laser parameters (i.e., pulse energy, focused spot size, wavelength, and pulse duration) for correlating single-event transients induced via two-photon absorption (TPA) and heavy ions is presented. The approach focuses on identification and extraction of waveform characteristics, or 'features,' and minimizing the error between features produced by TPA and ions. Modifying optical parameters can directly impact the waveform features of the TPA-induced transients. Consequently, optimal laser parameters that minimize the error between features extracted for laser-and ion-induced waveforms can be determined. In this paper, the laser pulse energy and spot size were varied, while maintaining a fixed pulse duration and wavelength, and the resulting transients were compared to ion-induced transients. When the optimized optical parameters are used, excellent agreement was achieved between laser-and ion-induced transient waveforms in a silicon-germanium heterojunction bipolar transistor (SiGe HBT). In addition, a one-to-one correlation between heavy-ion linear energy transfer (LET) and laser pulse energy was obtained for a particular spot size (ω0 = 1.89 μ m (HW 1/e2)). These results show that a correlation between LET and pulse energy is achievable when the remaining optical parameters are selected appropriately. Although the results presented are for SiGe HBTs, the generality of the approach should allow it to be extended to other semiconductor platforms.

Original languageEnglish
Article number8543177
Pages (from-to)359-367
Number of pages9
JournalIEEE Transactions on Nuclear Science
Volume66
Issue number1
DOIs
StatePublished - Jan 2019

Keywords

  • pulsed-laser testing
  • Radiation effects
  • silicon-germanium heterojunction bipolar transistors (SiGe HBTs)
  • single-event effects (SEEs)
  • two-photon absorption (TPA)

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