Optical nanospectroscopy study of ion-implanted silicon and biological growth medium

A. Cricenti; V. Marocchi; R. Generosi; M. Luce; P. Perfetti; D. Vobornik; G. Margaritondo; D. Talley; P. Thielen; J. S. Sanghera; I. D. Aggarwal; J. K. Miller; N. H. Tolk; D. W. Piston

doi:10.1016/S0925-8388(03)00557-7

Optical nanospectroscopy study of ion-implanted silicon and biological growth medium

A. Cricenti, V. Marocchi, R. Generosi, M. Luce, P. Perfetti, D. Vobornik, G. Margaritondo, D. Talley, P. Thielen, J. S. Sanghera, I. D. Aggarwal, J. K. Miller, N. H. Tolk, D. W. Piston

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Abstract

The advent of scanning near-field optical microscopy (SNOM) has augmented at the microscopic level the usefulness of IR spectroscopy. Two-dimensional imaging of chemical constituents makes this a very attractive and powerful new approach. In this paper we present SNOM results on boron-doped silicon and on biological growth medium by means of shear-force, reflectivity and photocurrent measurements. Such experiments allowed us to identify boron clusters embedded in silicon and the distribution of growth medium constituents with a lateral resolution well below the diffraction limit.

Original language	English
Pages (from-to)	21-25
Number of pages	5
Journal	Journal of Alloys and Compounds
Volume	362
Issue number	1-2
DOIs	https://doi.org/10.1016/S0925-8388(03)00557-7
State	Published - Jan 14 2004

Keywords

Internal photoemission
Nanostructures
Reflectivity
Scanning near-field optical microscopy

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Cricenti, A., Marocchi, V., Generosi, R., Luce, M., Perfetti, P., Vobornik, D., Margaritondo, G., Talley, D., Thielen, P., Sanghera, J. S., Aggarwal, I. D., Miller, J. K., Tolk, N. H., & Piston, D. W. (2004). Optical nanospectroscopy study of ion-implanted silicon and biological growth medium. Journal of Alloys and Compounds, 362(1-2), 21-25. https://doi.org/10.1016/S0925-8388(03)00557-7

@article{1d50f4c0c3f848e58d7e8cc1aa91f558,

title = "Optical nanospectroscopy study of ion-implanted silicon and biological growth medium",

abstract = "The advent of scanning near-field optical microscopy (SNOM) has augmented at the microscopic level the usefulness of IR spectroscopy. Two-dimensional imaging of chemical constituents makes this a very attractive and powerful new approach. In this paper we present SNOM results on boron-doped silicon and on biological growth medium by means of shear-force, reflectivity and photocurrent measurements. Such experiments allowed us to identify boron clusters embedded in silicon and the distribution of growth medium constituents with a lateral resolution well below the diffraction limit.",

keywords = "Internal photoemission, Nanostructures, Reflectivity, Scanning near-field optical microscopy",

author = "A. Cricenti and V. Marocchi and R. Generosi and M. Luce and P. Perfetti and D. Vobornik and G. Margaritondo and D. Talley and P. Thielen and Sanghera, {J. S.} and Aggarwal, {I. D.} and Miller, {J. K.} and Tolk, {N. H.} and Piston, {D. W.}",

note = "Funding Information: We would like to thank the entire staff of the Vanderbilt FEL center for their able assistance. This work is supported by the Italian National Research Council (CNR), by the Ecole Polytechnique F{\'e}d{\'e}rale de Lausanne and by the Fonds National Suisse de la Recherche Scientifique. The Vanderbilt FEL center is a national facility supported by the US Office of Naval Research.",

year = "2004",

month = jan,

day = "14",

doi = "10.1016/S0925-8388(03)00557-7",

language = "English",

volume = "362",

pages = "21--25",

journal = "Journal of Alloys and Compounds",

issn = "0925-8388",

number = "1-2",

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Cricenti, A, Marocchi, V, Generosi, R, Luce, M, Perfetti, P, Vobornik, D, Margaritondo, G, Talley, D, Thielen, P, Sanghera, JS, Aggarwal, ID, Miller, JK, Tolk, NH & Piston, DW 2004, 'Optical nanospectroscopy study of ion-implanted silicon and biological growth medium', Journal of Alloys and Compounds, vol. 362, no. 1-2, pp. 21-25. https://doi.org/10.1016/S0925-8388(03)00557-7

TY - JOUR

T1 - Optical nanospectroscopy study of ion-implanted silicon and biological growth medium

AU - Cricenti, A.

AU - Marocchi, V.

AU - Generosi, R.

AU - Luce, M.

AU - Perfetti, P.

AU - Vobornik, D.

AU - Margaritondo, G.

AU - Talley, D.

AU - Thielen, P.

AU - Sanghera, J. S.

AU - Aggarwal, I. D.

AU - Miller, J. K.

AU - Tolk, N. H.

AU - Piston, D. W.

N1 - Funding Information: We would like to thank the entire staff of the Vanderbilt FEL center for their able assistance. This work is supported by the Italian National Research Council (CNR), by the Ecole Polytechnique Fédérale de Lausanne and by the Fonds National Suisse de la Recherche Scientifique. The Vanderbilt FEL center is a national facility supported by the US Office of Naval Research.

PY - 2004/1/14

Y1 - 2004/1/14

N2 - The advent of scanning near-field optical microscopy (SNOM) has augmented at the microscopic level the usefulness of IR spectroscopy. Two-dimensional imaging of chemical constituents makes this a very attractive and powerful new approach. In this paper we present SNOM results on boron-doped silicon and on biological growth medium by means of shear-force, reflectivity and photocurrent measurements. Such experiments allowed us to identify boron clusters embedded in silicon and the distribution of growth medium constituents with a lateral resolution well below the diffraction limit.

AB - The advent of scanning near-field optical microscopy (SNOM) has augmented at the microscopic level the usefulness of IR spectroscopy. Two-dimensional imaging of chemical constituents makes this a very attractive and powerful new approach. In this paper we present SNOM results on boron-doped silicon and on biological growth medium by means of shear-force, reflectivity and photocurrent measurements. Such experiments allowed us to identify boron clusters embedded in silicon and the distribution of growth medium constituents with a lateral resolution well below the diffraction limit.

KW - Internal photoemission

KW - Nanostructures

KW - Reflectivity

KW - Scanning near-field optical microscopy

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U2 - 10.1016/S0925-8388(03)00557-7

DO - 10.1016/S0925-8388(03)00557-7

M3 - Article

AN - SCOPUS:0344466443

SN - 0925-8388

VL - 362

SP - 21

EP - 25

JO - Journal of Alloys and Compounds

JF - Journal of Alloys and Compounds

IS - 1-2

ER -

Optical nanospectroscopy study of ion-implanted silicon and biological growth medium

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Keywords

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