Optical nanospectroscopy applications in material science

A. Cricenti; G. Longo; A. Ustione; V. Mussi; R. Generosi; M. Luce; M. Rinaldi; P. Perfetti; D. Vobornik; G. Margaritondo; J. S. Sanghera; P. Thielen; I. D. Aggarwal; B. Ivanov; J. K. Miller; R. Haglund; N. H. Tolk; A. Congiu-Castellano; M. A. Rizzo; D. W. Piston; F. Somma; G. Baldacchini; F. Bonfigli; T. Marolo; F. Flora; R. M. Montereali; A. Faenov; T. Pikuz

doi:10.1016/j.apsusc.2004.05.023

Optical nanospectroscopy applications in material science

A. Cricenti, G. Longo, A. Ustione, V. Mussi, R. Generosi, M. Luce, M. Rinaldi, P. Perfetti, D. Vobornik, G. Margaritondo, J. S. Sanghera, P. Thielen, I. D. Aggarwal, B. Ivanov, J. K. Miller, R. Haglund, N. H. Tolk, A. Congiu-Castellano, M. A. Rizzo, D. W. PistonF. Somma, G. Baldacchini, F. Bonfigli, T. Marolo, F. Flora, R. M. Montereali, A. Faenov, T. Pikuz

Research output: Contribution to journal › Conference article › peer-review

4 Scopus citations

Abstract

The advent of scanning near-field optical microscopy (SNOM) has augmented at a microscopic level the usefulness of optical spectroscopy in the region between 300nm and 10μm. Two-dimensional imaging of chemical constituents makes this a very attractive and powerful new approach. In this paper we show SNOM results obtained in several geometrical configurations on boron clusters in silicon, Li clusters embedded in a LiF sample and BN growth on silicon. We also show some results on the wavelength dependence of the reflectivity (R) in the near infrared (IR) of biological cells in liquid environment with the observation of the local fluorescence. The SNOM images revealed features that were not present in the corresponding shear-force (SF) images and which were due to localized changes in the bulk properties of the sample. The size of the smallest detected features clearly demonstrated that near-field conditions were reached both in the visible and infrared region.

Original language	English
Pages (from-to)	374-386
Number of pages	13
Journal	Applied Surface Science
Volume	234
Issue number	1-4
DOIs	https://doi.org/10.1016/j.apsusc.2004.05.023
State	Published - Jul 15 2004
Event	The Ninth International Conference on the Formation of Semicon - Madrid, Spain Duration: Sep 15 2003 → Sep 19 2003

Keywords

Infrared
Photocurrent
SNOM

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10.1016/j.apsusc.2004.05.023

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Cricenti, A., Longo, G., Ustione, A., Mussi, V., Generosi, R., Luce, M., Rinaldi, M., Perfetti, P., Vobornik, D., Margaritondo, G., Sanghera, J. S., Thielen, P., Aggarwal, I. D., Ivanov, B., Miller, J. K., Haglund, R., Tolk, N. H., Congiu-Castellano, A., Rizzo, M. A., ... Pikuz, T. (2004). Optical nanospectroscopy applications in material science. Applied Surface Science, 234(1-4), 374-386. https://doi.org/10.1016/j.apsusc.2004.05.023

@article{dfd46d5f16c64196a4bb5492bac6fc14,

title = "Optical nanospectroscopy applications in material science",

abstract = "The advent of scanning near-field optical microscopy (SNOM) has augmented at a microscopic level the usefulness of optical spectroscopy in the region between 300nm and 10μm. Two-dimensional imaging of chemical constituents makes this a very attractive and powerful new approach. In this paper we show SNOM results obtained in several geometrical configurations on boron clusters in silicon, Li clusters embedded in a LiF sample and BN growth on silicon. We also show some results on the wavelength dependence of the reflectivity (R) in the near infrared (IR) of biological cells in liquid environment with the observation of the local fluorescence. The SNOM images revealed features that were not present in the corresponding shear-force (SF) images and which were due to localized changes in the bulk properties of the sample. The size of the smallest detected features clearly demonstrated that near-field conditions were reached both in the visible and infrared region.",

keywords = "Infrared, Photocurrent, SNOM",

author = "A. Cricenti and G. Longo and A. Ustione and V. Mussi and R. Generosi and M. Luce and M. Rinaldi and P. Perfetti and D. Vobornik and G. Margaritondo and Sanghera, {J. S.} and P. Thielen and Aggarwal, {I. D.} and B. Ivanov and Miller, {J. K.} and R. Haglund and Tolk, {N. H.} and A. Congiu-Castellano and Rizzo, {M. A.} and Piston, {D. W.} and F. Somma and G. Baldacchini and F. Bonfigli and T. Marolo and F. Flora and Montereali, {R. M.} and A. Faenov and T. Pikuz",

year = "2004",

month = jul,

day = "15",

doi = "10.1016/j.apsusc.2004.05.023",

language = "English",

volume = "234",

pages = "374--386",

journal = "Applied Surface Science",

issn = "0169-4332",

number = "1-4",

note = "The Ninth International Conference on the Formation of Semicon ; Conference date: 15-09-2003 Through 19-09-2003",

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Cricenti, A, Longo, G, Ustione, A, Mussi, V, Generosi, R, Luce, M, Rinaldi, M, Perfetti, P, Vobornik, D, Margaritondo, G, Sanghera, JS, Thielen, P, Aggarwal, ID, Ivanov, B, Miller, JK, Haglund, R, Tolk, NH, Congiu-Castellano, A, Rizzo, MA, Piston, DW, Somma, F, Baldacchini, G, Bonfigli, F, Marolo, T, Flora, F, Montereali, RM, Faenov, A & Pikuz, T 2004, 'Optical nanospectroscopy applications in material science', Applied Surface Science, vol. 234, no. 1-4, pp. 374-386. https://doi.org/10.1016/j.apsusc.2004.05.023

TY - JOUR

T1 - Optical nanospectroscopy applications in material science

AU - Cricenti, A.

AU - Longo, G.

AU - Ustione, A.

AU - Mussi, V.

AU - Generosi, R.

AU - Luce, M.

AU - Rinaldi, M.

AU - Perfetti, P.

AU - Vobornik, D.

AU - Margaritondo, G.

AU - Sanghera, J. S.

AU - Thielen, P.

AU - Aggarwal, I. D.

AU - Ivanov, B.

AU - Miller, J. K.

AU - Haglund, R.

AU - Tolk, N. H.

AU - Congiu-Castellano, A.

AU - Rizzo, M. A.

AU - Piston, D. W.

AU - Somma, F.

AU - Baldacchini, G.

AU - Bonfigli, F.

AU - Marolo, T.

AU - Flora, F.

AU - Montereali, R. M.

AU - Faenov, A.

AU - Pikuz, T.

PY - 2004/7/15

Y1 - 2004/7/15

N2 - The advent of scanning near-field optical microscopy (SNOM) has augmented at a microscopic level the usefulness of optical spectroscopy in the region between 300nm and 10μm. Two-dimensional imaging of chemical constituents makes this a very attractive and powerful new approach. In this paper we show SNOM results obtained in several geometrical configurations on boron clusters in silicon, Li clusters embedded in a LiF sample and BN growth on silicon. We also show some results on the wavelength dependence of the reflectivity (R) in the near infrared (IR) of biological cells in liquid environment with the observation of the local fluorescence. The SNOM images revealed features that were not present in the corresponding shear-force (SF) images and which were due to localized changes in the bulk properties of the sample. The size of the smallest detected features clearly demonstrated that near-field conditions were reached both in the visible and infrared region.

AB - The advent of scanning near-field optical microscopy (SNOM) has augmented at a microscopic level the usefulness of optical spectroscopy in the region between 300nm and 10μm. Two-dimensional imaging of chemical constituents makes this a very attractive and powerful new approach. In this paper we show SNOM results obtained in several geometrical configurations on boron clusters in silicon, Li clusters embedded in a LiF sample and BN growth on silicon. We also show some results on the wavelength dependence of the reflectivity (R) in the near infrared (IR) of biological cells in liquid environment with the observation of the local fluorescence. The SNOM images revealed features that were not present in the corresponding shear-force (SF) images and which were due to localized changes in the bulk properties of the sample. The size of the smallest detected features clearly demonstrated that near-field conditions were reached both in the visible and infrared region.

KW - Infrared

KW - Photocurrent

KW - SNOM

UR - http://www.scopus.com/inward/record.url?scp=3342875869&partnerID=8YFLogxK

U2 - 10.1016/j.apsusc.2004.05.023

DO - 10.1016/j.apsusc.2004.05.023

M3 - Conference article

AN - SCOPUS:3342875869

SN - 0169-4332

VL - 234

SP - 374

EP - 386

JO - Applied Surface Science

JF - Applied Surface Science

IS - 1-4

T2 - The Ninth International Conference on the Formation of Semicon

Y2 - 15 September 2003 through 19 September 2003

ER -

Optical nanospectroscopy applications in material science

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Keywords

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