Novel dielectric anomaly in the hole-doped La2Cu 1-xLixO4 and La2-xSr xNiO4 insulators: Signature of an electronic glassy state

  • Tuson Park
  • , Z. Nussinov
  • , K. R.A. Hazzard
  • , V. A. Sidorov
  • , A. V. Balatsky
  • , J. L. Sarrao
  • , S. W. Cheong
  • , M. F. Hundley
  • , Jang Sik Lee
  • , Q. X. Jia
  • , J. D. Thompson

Research output: Contribution to journalArticlepeer-review

100 Scopus citations

Abstract

The low-frequency dielectric response of hole-doped insulators La 2Cu1-xLixO4 and La 2-xSrxNiO4 shows a large dielectric constant ε′ at high temperature and a steplike drop by a factor of 100 at a material-dependent low temperature Tf. Tf increases with frequency, and the dielectric response shows universal scaling in a Cole-Cole plot, suggesting that a charge-glass state is realized both in the cuprates and in the nickelates.

Original languageEnglish
Article number017002
JournalPhysical Review Letters
Volume94
Issue number1
DOIs
StatePublished - Jan 14 2005

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