Abstract
The low-frequency dielectric response of hole-doped insulators La 2Cu1-xLixO4 and La 2-xSrxNiO4 shows a large dielectric constant ε′ at high temperature and a steplike drop by a factor of 100 at a material-dependent low temperature Tf. Tf increases with frequency, and the dielectric response shows universal scaling in a Cole-Cole plot, suggesting that a charge-glass state is realized both in the cuprates and in the nickelates.
| Original language | English |
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| Article number | 017002 |
| Journal | Physical Review Letters |
| Volume | 94 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jan 14 2005 |