TY - JOUR
T1 - New approach toward transparent and conductive ZnO by atomic layer deposition
T2 - Hydrogen plasma doping
AU - Thomas, Matthew A.
AU - Armstrong, Johnathan C.
AU - Cui, Jingbiao
N1 - Funding Information:
This work was supported by the National Science Foundation under Award No. EPS-1003970. The authors would like to thank the UALR Nanotechnology Center for use of its SEM and XRD facilities.
PY - 2013/1
Y1 - 2013/1
N2 - A hydrogen plasma doping process was combined with the traditional atomic layer deposition (ALD) technique in order to enhance the transparency and conductivity of ZnO films. The hydrogen plasma was included in situ during each ALD cycle and was found to be more effective at producing highly conductive ZnO when used before the H2O vapor pulse that is standard to thermal-ALD processes. Through the hydrogen plasma doping process, the resistivity and carrier concentration of the ALD ZnO films are improved to levels suitable for transparent conductive oxide applications. These favorable electrical properties, combined with improved transparency, make such H-doped ZnO films comparable to some of the best Al-doped ZnO materials achieved with ALD processes in the literature. At thicknesses well below 200 nm, the H-doped ALD ZnO films maintain optimal resistivities near 7 × 10-4 Ω cm along with average transmittance values of ∼92% from 400 to 1000 nm.
AB - A hydrogen plasma doping process was combined with the traditional atomic layer deposition (ALD) technique in order to enhance the transparency and conductivity of ZnO films. The hydrogen plasma was included in situ during each ALD cycle and was found to be more effective at producing highly conductive ZnO when used before the H2O vapor pulse that is standard to thermal-ALD processes. Through the hydrogen plasma doping process, the resistivity and carrier concentration of the ALD ZnO films are improved to levels suitable for transparent conductive oxide applications. These favorable electrical properties, combined with improved transparency, make such H-doped ZnO films comparable to some of the best Al-doped ZnO materials achieved with ALD processes in the literature. At thicknesses well below 200 nm, the H-doped ALD ZnO films maintain optimal resistivities near 7 × 10-4 Ω cm along with average transmittance values of ∼92% from 400 to 1000 nm.
UR - https://www.scopus.com/pages/publications/84871861730
U2 - 10.1116/1.4768172
DO - 10.1116/1.4768172
M3 - Article
AN - SCOPUS:84871861730
SN - 0734-2101
VL - 31
JO - Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
JF - Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
IS - 1
M1 - 01A130
ER -