TY - GEN
T1 - Microsphere-assisted microscopy
T2 - Optical Measurement Systems for Industrial Inspection XIII 2023
AU - Darafsheh, Arash
AU - Abbasian, Vahid
N1 - Publisher Copyright:
© 2023 SPIE.
PY - 2023
Y1 - 2023
N2 - Optical microscopy is one the oldest and most widely used techniques for sample inspection in life and material sciences. Microsphere-assisted microscopy (MAM) has emerged as a simple yet efficient approach to boost the spatial resolution. MAM uses a microsphere, placed in the immediate vicinity of the object, to enhance the numerical aperture and improve the resolution. MAM can be used in conjunction with white-light, wide-field, bright-field, dark-field, confocal, fluorescent, second harmonic generation, two-photon, interferometric, and digital holographic microscopies. It can be employed in reflection and transmission modes. There are several open questions and challenges associated with MAM, including the resolution limit, the mechanism behind resolution improvement, and the limited imaging field-of-view. Here, we present the progress in MAM in the past decade along with the associated opportunities and challenges.
AB - Optical microscopy is one the oldest and most widely used techniques for sample inspection in life and material sciences. Microsphere-assisted microscopy (MAM) has emerged as a simple yet efficient approach to boost the spatial resolution. MAM uses a microsphere, placed in the immediate vicinity of the object, to enhance the numerical aperture and improve the resolution. MAM can be used in conjunction with white-light, wide-field, bright-field, dark-field, confocal, fluorescent, second harmonic generation, two-photon, interferometric, and digital holographic microscopies. It can be employed in reflection and transmission modes. There are several open questions and challenges associated with MAM, including the resolution limit, the mechanism behind resolution improvement, and the limited imaging field-of-view. Here, we present the progress in MAM in the past decade along with the associated opportunities and challenges.
KW - Microscopy
KW - digital holography
KW - microsphere
KW - nanoscopy
KW - resolution
UR - http://www.scopus.com/inward/record.url?scp=85172674045&partnerID=8YFLogxK
U2 - 10.1117/12.2681499
DO - 10.1117/12.2681499
M3 - Conference contribution
AN - SCOPUS:85172674045
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Optical Measurement Systems for Industrial Inspection XIII
A2 - Lehmann, Peter
PB - SPIE
Y2 - 26 June 2023 through 29 June 2023
ER -