Microsphere-assisted microscopy: challenges and opportunities

Arash Darafsheh, Vahid Abbasian

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Optical microscopy is one the oldest and most widely used techniques for sample inspection in life and material sciences. Microsphere-assisted microscopy (MAM) has emerged as a simple yet efficient approach to boost the spatial resolution. MAM uses a microsphere, placed in the immediate vicinity of the object, to enhance the numerical aperture and improve the resolution. MAM can be used in conjunction with white-light, wide-field, bright-field, dark-field, confocal, fluorescent, second harmonic generation, two-photon, interferometric, and digital holographic microscopies. It can be employed in reflection and transmission modes. There are several open questions and challenges associated with MAM, including the resolution limit, the mechanism behind resolution improvement, and the limited imaging field-of-view. Here, we present the progress in MAM in the past decade along with the associated opportunities and challenges.

Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection XIII
EditorsPeter Lehmann
PublisherSPIE
ISBN (Electronic)9781510664456
DOIs
StatePublished - 2023
EventOptical Measurement Systems for Industrial Inspection XIII 2023 - Munich, Germany
Duration: Jun 26 2023Jun 29 2023

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12618
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical Measurement Systems for Industrial Inspection XIII 2023
Country/TerritoryGermany
CityMunich
Period06/26/2306/29/23

Keywords

  • digital holography
  • Microscopy
  • microsphere
  • nanoscopy
  • resolution

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