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Methods for the ICP-OES Analysis of Semiconductor Materials
Calynn Morrison
, Haochen Sun
, Yuewei Yao
, Richard A. Loomis
, William E. Buhro
Department of Chemistry
Research output
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Contribution to journal
›
Article
›
peer-review
57
Scopus citations
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Keyphrases
Spectroscopic Analysis
100%
Inductively Coupled Plasma Atomic Emission Spectrometry
100%
Semiconductor Materials
100%
Sample Preparation
33%
III-V
33%
Nanocrystals
33%
Result Reproducibility
33%
Compositional Analysis
33%
Calibration Standard
33%
II-VI
33%
Element Zn
33%
II-VI Nanocrystals
33%
Chemistry
Nanocrystalline Material
100%
Inductively Coupled Plasma
100%
Optical Emission Spectroscopy
100%