Abstract
Two methods of obtaining useful estimates of the total vector magnetization in thin film longitudinal media was outlined from magnetic force microscopy (MFM) measurements. The first thin film medium model assumed fixed thickness and fixed magnetization magnitude. The second estimation method models the MFM image as a two dimensional random process that depended upon the grain magnetization angles.
| Original language | English |
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| Pages (from-to) | BD06 |
| Journal | Digests of the Intermag Conference |
| State | Published - 2002 |
| Event | 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands Duration: Apr 28 2002 → May 2 2002 |