Magnetization estimation from MFM images

Chi Chun Hsu, Clayton T. Miller, Ronald S. Indeck, Joseph A. O'Sullivan, Marcel W. Muller

Research output: Contribution to journalConference articlepeer-review

Abstract

Two methods of obtaining useful estimates of the total vector magnetization in thin film longitudinal media was outlined from magnetic force microscopy (MFM) measurements. The first thin film medium model assumed fixed thickness and fixed magnetization magnitude. The second estimation method models the MFM image as a two dimensional random process that depended upon the grain magnetization angles.

Original languageEnglish
Pages (from-to)BD06
JournalDigests of the Intermag Conference
StatePublished - 2002
Event2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands
Duration: Apr 28 2002May 2 2002

Fingerprint

Dive into the research topics of 'Magnetization estimation from MFM images'. Together they form a unique fingerprint.

Cite this