Abstract
We have developed a method to estimate the complete magnetization in thin-film longitudinal recording media from magnetic force microscopy (MFM) data. The method uses a medium model described by a Voronoi tessellation of the film plane. The magnetization lies in that plane, has constant magnitude, and is uniform within each convex region, or grain, of the tessellation. The effect of a single grain on the MFM simulation is isolated by considering the difference between the MFM images before and after that grain undergoes a 180° magnetization reversal. Using this difference image, the complete magnetization of the grain and the grain's boundaries are estimated. By isolating each grain in turn, as if a series of incremental applied fields had been applied, the magnetization for the whole pattern is estimated.
| Original language | English |
|---|---|
| Pages (from-to) | 2444-2446 |
| Number of pages | 3 |
| Journal | IEEE Transactions on Magnetics |
| Volume | 38 |
| Issue number | 5 I |
| DOIs | |
| State | Published - Sep 2002 |
| Event | 2002 International Magnetics Conference (Intermag 2002) - Amsterdam, Netherlands Duration: Apr 28 2002 → May 2 2002 |
Keywords
- Irrotational and solenoidal components
- Magnetic force microscopy (MFM)
- Magnetization reversal
- Voronoi tessellation