Magnetization estimation from MFM images

  • Chi Chun Hsu
  • , Clayton T. Miller
  • , Ronald S. Indeck
  • , Joseph A. O'Sullivan
  • , Marcel W. Muller

Research output: Contribution to journalConference articlepeer-review

4 Scopus citations

Abstract

We have developed a method to estimate the complete magnetization in thin-film longitudinal recording media from magnetic force microscopy (MFM) data. The method uses a medium model described by a Voronoi tessellation of the film plane. The magnetization lies in that plane, has constant magnitude, and is uniform within each convex region, or grain, of the tessellation. The effect of a single grain on the MFM simulation is isolated by considering the difference between the MFM images before and after that grain undergoes a 180° magnetization reversal. Using this difference image, the complete magnetization of the grain and the grain's boundaries are estimated. By isolating each grain in turn, as if a series of incremental applied fields had been applied, the magnetization for the whole pattern is estimated.

Original languageEnglish
Pages (from-to)2444-2446
Number of pages3
JournalIEEE Transactions on Magnetics
Volume38
Issue number5 I
DOIs
StatePublished - Sep 2002
Event2002 International Magnetics Conference (Intermag 2002) - Amsterdam, Netherlands
Duration: Apr 28 2002May 2 2002

Keywords

  • Irrotational and solenoidal components
  • Magnetic force microscopy (MFM)
  • Magnetization reversal
  • Voronoi tessellation

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