IR-SNOM on lithium fluoride films with regular arrays based on colour centres

  • A. Cricenti
  • , G. Longo
  • , V. Mussi
  • , R. Generosi
  • , M. Luce
  • , P. Perfetti
  • , D. Vobornik
  • , G. Margaritondo
  • , P. Thielen
  • , J. S. Sanghera
  • , I. D. Aggarwal
  • , N. H. Tolk
  • , G. Baldacchini
  • , F. Bonfigli
  • , F. Flora
  • , T. Marolo
  • , R. M. Montereali
  • , A. Faenov
  • , T. Pikuz
  • , F. Somma
  • D. W. Piston

Research output: Contribution to journalConference articlepeer-review

6 Scopus citations

Abstract

LiF films have been grown on silicon substrate, irradiated with soft x-rays to create fluorescent regular micrometric-spaced arrays based on colour centres, and studied by Scanning Near-field Optical Microscope (SNOM). Strong variations in the local reflectivity have been observed in the infrared region between 6.1 and 9.2 μm and tentatively ascribed to a modulated variation of the refractive index of the coloured zone with respect to that of the uncoloured LiF matrix.

Original languageEnglish
Pages (from-to)3075-3080
Number of pages6
JournalPhysica Status Solidi C: Conferences
Issue number8
DOIs
StatePublished - 2003
Event5th International Conference on Optics of Surfaces and Interfaces, OSI 2003 - Leon, Mexico
Duration: May 26 2003May 30 2003

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