IR-SNOM on lithium fluoride films with regular arrays based on colour centres

A. Cricenti, G. Longo, V. Mussi, R. Generosi, M. Luce, P. Perfetti, D. Vobornik, G. Margaritondo, P. Thielen, J. S. Sanghera, I. D. Aggarwal, N. H. Tolk, G. Baldacchini, F. Bonfigli, F. Flora, T. Marolo, R. M. Montereali, A. Faenov, T. Pikuz, F. SommaD. W. Piston

Research output: Contribution to journalConference articlepeer-review

6 Scopus citations


LiF films have been grown on silicon substrate, irradiated with soft x-rays to create fluorescent regular micrometric-spaced arrays based on colour centres, and studied by Scanning Near-field Optical Microscope (SNOM). Strong variations in the local reflectivity have been observed in the infrared region between 6.1 and 9.2 μm and tentatively ascribed to a modulated variation of the refractive index of the coloured zone with respect to that of the uncoloured LiF matrix.

Original languageEnglish
Pages (from-to)3075-3080
Number of pages6
JournalPhysica Status Solidi C: Conferences
Issue number8
StatePublished - 2003
Event5th International Conference on Optics of Surfaces and Interfaces, OSI 2003 - Leon, Mexico
Duration: May 26 2003May 30 2003


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