Abstract
LiF films have been grown on silicon substrate, irradiated with soft x-rays to create fluorescent regular micrometric-spaced arrays based on colour centres, and studied by Scanning Near-field Optical Microscope (SNOM). Strong variations in the local reflectivity have been observed in the infrared region between 6.1 and 9.2 μm and tentatively ascribed to a modulated variation of the refractive index of the coloured zone with respect to that of the uncoloured LiF matrix.
Original language | English |
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Pages (from-to) | 3075-3080 |
Number of pages | 6 |
Journal | Physica Status Solidi C: Conferences |
Issue number | 8 |
DOIs | |
State | Published - 2003 |
Event | 5th International Conference on Optics of Surfaces and Interfaces, OSI 2003 - Leon, Mexico Duration: May 26 2003 → May 30 2003 |