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Intrinsic point defects and intergrowths in layered bismuth triiodide
Sung Beom Cho
, Jaume Gazquez
, Xing Huang
, Yoon Myung
, Parag Banerjee
, Rohan Mishra
Department of Mechanical Engineering & Materials Science
McKelvey School of Engineering
Research output
:
Contribution to journal
›
Article
›
peer-review
16
Scopus citations
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Keyphrases
Bismuth Triiodide
100%
Intrinsic Point Defects
100%
BiI3
100%
Semiconductors
83%
Defect Tolerant
83%
Atomic Scale
33%
Edge Characteristics
16%
Absorbance
16%
Growth Conditions
16%
Defect Type
16%
Electronic Structure
16%
Density Functional Calculations
16%
Band Gap
16%
Electronic Properties
16%
Valence Band Edge
16%
Photovoltaic Applications
16%
Band Edge
16%
Iodine Atom
16%
Metallic Behavior
16%
Formation Energy
16%
Aberration-corrected
16%
Fault Tolerance
16%
Scanning Transmission Electron Microscope
16%
Lone Pair
16%
Scale Control
16%
Carrier Trapping
16%
High Carrier Concentration
16%
Nonradiative Recombination Center
16%
Bismuth Ions
16%
Transmission Electron Microscope Imaging
16%
Antibonding States
16%
Material Science
Point Defect
100%
Bismuth
100%
Density
33%
Photovoltaics
33%
Carrier Concentration
33%
Electronic Property
33%