Infrared spectroscopy of synthetic and natural stishovite

A. M. Hofmeister; J. Xu; S. Akimoto

Infrared spectroscopy of synthetic and natural stishovite

A. M. Hofmeister
, J. Xu
, S. Akimoto

Department of Earth & Planetary Sciences

Research output: Contribution to journal › Article › peer-review

40 Scopus citations

Abstract

Single-crystal and polycrystalline reflectance and thin-film absorption infrared spectra for synthetic stishovite exhibit a pattern characteristic of the rutile structure. Three E_u LO-TO fundamentals were observed at 1020-820, 700-580, and 565-470 mc^-1, and one A_2u mode was found at 950-675 cm^-1. The LO-TO range of the highest energy Si-O octahedral stretch overlaps considerably with that of Si-O tetrahedral stretches in orthosilicates from 1060-850 cm^-1 and in tectosilicates from 1250-950 cm^-1. Excess bands in both IR and Raman spectra are best explained by (SiF₆)^2- contamination. The IR data indicate an ordered structure that is free of SiO₂ glass impurities. -from Authors

Original language	English
Pages (from-to)	951-955
Number of pages	5
Journal	American Mineralogist
Volume	75
Issue number	9-10
State	Published - 1990

Cite this

@article{a81b6dcfe1a94bd9a27372c6bbbefba4,

title = "Infrared spectroscopy of synthetic and natural stishovite",

abstract = "Single-crystal and polycrystalline reflectance and thin-film absorption infrared spectra for synthetic stishovite exhibit a pattern characteristic of the rutile structure. Three Eu LO-TO fundamentals were observed at 1020-820, 700-580, and 565-470 mc -1, and one A2u mode was found at 950-675 cm-1. The LO-TO range of the highest energy Si-O octahedral stretch overlaps considerably with that of Si-O tetrahedral stretches in orthosilicates from 1060-850 cm-1 and in tectosilicates from 1250-950 cm-1. Excess bands in both IR and Raman spectra are best explained by (SiF6)2- contamination. The IR data indicate an ordered structure that is free of SiO2 glass impurities. -from Authors",

author = "Hofmeister, \{A. M.\} and J. Xu and S. Akimoto",

year = "1990",

language = "English",

volume = "75",

pages = "951--955",

journal = "American Mineralogist",

issn = "0003-004X",

number = "9-10",

}

TY - JOUR

T1 - Infrared spectroscopy of synthetic and natural stishovite

AU - Hofmeister, A. M.

AU - Xu, J.

AU - Akimoto, S.

PY - 1990

Y1 - 1990

N2 - Single-crystal and polycrystalline reflectance and thin-film absorption infrared spectra for synthetic stishovite exhibit a pattern characteristic of the rutile structure. Three Eu LO-TO fundamentals were observed at 1020-820, 700-580, and 565-470 mc -1, and one A2u mode was found at 950-675 cm-1. The LO-TO range of the highest energy Si-O octahedral stretch overlaps considerably with that of Si-O tetrahedral stretches in orthosilicates from 1060-850 cm-1 and in tectosilicates from 1250-950 cm-1. Excess bands in both IR and Raman spectra are best explained by (SiF6)2- contamination. The IR data indicate an ordered structure that is free of SiO2 glass impurities. -from Authors

AB - Single-crystal and polycrystalline reflectance and thin-film absorption infrared spectra for synthetic stishovite exhibit a pattern characteristic of the rutile structure. Three Eu LO-TO fundamentals were observed at 1020-820, 700-580, and 565-470 mc -1, and one A2u mode was found at 950-675 cm-1. The LO-TO range of the highest energy Si-O octahedral stretch overlaps considerably with that of Si-O tetrahedral stretches in orthosilicates from 1060-850 cm-1 and in tectosilicates from 1250-950 cm-1. Excess bands in both IR and Raman spectra are best explained by (SiF6)2- contamination. The IR data indicate an ordered structure that is free of SiO2 glass impurities. -from Authors

UR - https://www.scopus.com/pages/publications/0025682911

M3 - Article

AN - SCOPUS:0025682911

SN - 0003-004X

VL - 75

SP - 951

EP - 955

JO - American Mineralogist

JF - American Mineralogist

IS - 9-10

ER -

Infrared spectroscopy of synthetic and natural stishovite

Abstract

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