Abstract
Scanning near-field optical microscopy (SNOM) makes it routinely possible to overcome the fundamental diffraction limit of standard (far-field) microscopy. Recently, aperture-based infrared SNOM performed in the spectroscopic mode, using the Vanderbilt University free electron laser, started delivering spatially-resolved information on the distribution of chemical species and on other laterally-fluctuating properties. The practical examples presented here show the great potential of this new technique both in materials science and in life sciences.
Original language | English |
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Pages (from-to) | 409-416 |
Number of pages | 8 |
Journal | Infrared Physics and Technology |
Volume | 45 |
Issue number | 5-6 |
DOIs | |
State | Published - Oct 2004 |
Event | International Workshop on Infrared Microscopy and Spectroscopy - Lake Tahoe, CA, United States Duration: Jul 8 2003 → Aug 11 2003 |