Scanning near-field optical microscopy (SNOM) makes it routinely possible to overcome the fundamental diffraction limit of standard (far-field) microscopy. Recently, aperture-based infrared SNOM performed in the spectroscopic mode, using the Vanderbilt University free electron laser, started delivering spatially-resolved information on the distribution of chemical species and on other laterally-fluctuating properties. The practical examples presented here show the great potential of this new technique both in materials science and in life sciences.
|Number of pages||8|
|Journal||Infrared Physics and Technology|
|State||Published - Oct 2004|
|Event||International Workshop on Infrared Microscopy and Spectroscopy - Lake Tahoe, CA, United States|
Duration: Jul 8 2003 → Aug 11 2003