Infrared near-field microscopy with the Vanderbilt free electron laser: Overview and perspectives

D. Vobornik, G. Margaritondo, J. S. Sanghera, P. Thielen, I. D. Aggarwal, B. Ivanov, J. K. Miller, R. Haglund, N. H. Tolk, A. Congiu-Castellano, M. A. Rizzo, D. W. Piston, F. Somma, G. Baldacchini, F. Bonfigli, T. Marolo, F. Flora, R. M. Montereali, A. Faenov, T. PikuzG. Longo, V. Mussi, R. Generosi, M. Luce, P. Perfetti, A. Cricenti

Research output: Contribution to journalConference articlepeer-review

11 Scopus citations

Abstract

Scanning near-field optical microscopy (SNOM) makes it routinely possible to overcome the fundamental diffraction limit of standard (far-field) microscopy. Recently, aperture-based infrared SNOM performed in the spectroscopic mode, using the Vanderbilt University free electron laser, started delivering spatially-resolved information on the distribution of chemical species and on other laterally-fluctuating properties. The practical examples presented here show the great potential of this new technique both in materials science and in life sciences.

Original languageEnglish
Pages (from-to)409-416
Number of pages8
JournalInfrared Physics and Technology
Volume45
Issue number5-6
DOIs
StatePublished - Oct 2004
EventInternational Workshop on Infrared Microscopy and Spectroscopy - Lake Tahoe, CA, United States
Duration: Jul 8 2003Aug 11 2003

Fingerprint

Dive into the research topics of 'Infrared near-field microscopy with the Vanderbilt free electron laser: Overview and perspectives'. Together they form a unique fingerprint.

Cite this