In situ high-energy x-ray diffraction study of the local structure of supercooled liquid Si

T. H. Kim; G. W. Lee; B. Sieve; A. K. Gangopadhyay; R. W. Hyers; T. J. Rathz; J. R. Rogers; D. S. Robinson; K. F. Kelton; A. I. Goldman

doi:10.1103/PhysRevLett.95.085501

In situ high-energy x-ray diffraction study of the local structure of supercooled liquid Si

T. H. Kim, G. W. Lee, B. Sieve, A. K. Gangopadhyay, R. W. Hyers, T. J. Rathz, J. R. Rogers, D. S. Robinson, K. F. Kelton, A. I. Goldman

Department of Physics

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74 Scopus citations

Abstract

Employing the technique of electrostatic levitation, coupled with high-energy x-ray diffraction and rapid data acquisition methods, we have obtained high quality structural data more deeply into the supercooled regime of liquid silicon than has been possible before. No change in coordination number is observed in this temperature region, calling into question previous experimental claims of structural evidence for the existence of a liquid-liquid phase transition.

Original language	English
Article number	085501
Journal	Physical Review Letters
Volume	95
Issue number	8
DOIs	https://doi.org/10.1103/PhysRevLett.95.085501
State	Published - Aug 19 2005

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10.1103/PhysRevLett.95.085501

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abstract = "Employing the technique of electrostatic levitation, coupled with high-energy x-ray diffraction and rapid data acquisition methods, we have obtained high quality structural data more deeply into the supercooled regime of liquid silicon than has been possible before. No change in coordination number is observed in this temperature region, calling into question previous experimental claims of structural evidence for the existence of a liquid-liquid phase transition.",

author = "Kim, {T. H.} and Lee, {G. W.} and B. Sieve and Gangopadhyay, {A. K.} and Hyers, {R. W.} and Rathz, {T. J.} and Rogers, {J. R.} and Robinson, {D. S.} and Kelton, {K. F.} and Goldman, {A. I.}",

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AU - Kim, T. H.

AU - Lee, G. W.

AU - Sieve, B.

AU - Gangopadhyay, A. K.

AU - Hyers, R. W.

AU - Rathz, T. J.

AU - Rogers, J. R.

AU - Robinson, D. S.

AU - Kelton, K. F.

AU - Goldman, A. I.

PY - 2005/8/19

Y1 - 2005/8/19

N2 - Employing the technique of electrostatic levitation, coupled with high-energy x-ray diffraction and rapid data acquisition methods, we have obtained high quality structural data more deeply into the supercooled regime of liquid silicon than has been possible before. No change in coordination number is observed in this temperature region, calling into question previous experimental claims of structural evidence for the existence of a liquid-liquid phase transition.

AB - Employing the technique of electrostatic levitation, coupled with high-energy x-ray diffraction and rapid data acquisition methods, we have obtained high quality structural data more deeply into the supercooled regime of liquid silicon than has been possible before. No change in coordination number is observed in this temperature region, calling into question previous experimental claims of structural evidence for the existence of a liquid-liquid phase transition.

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In situ high-energy x-ray diffraction study of the local structure of supercooled liquid Si

Abstract

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