Abstract
A new mwthod for removing multiple scattering artifacts from electron energy-loss data at any scattering angle is presented. We have applied the method to the aluminum K-edge. In the forward scattering direction the results agree with a previously described, one-dimensional deconvolution method.
| Original language | English |
|---|---|
| Pages (from-to) | 317-323 |
| Number of pages | 7 |
| Journal | Ultramicroscopy |
| Volume | 19 |
| Issue number | 4 |
| DOIs | |
| State | Published - 1986 |