Abstract
A new method for removing multiple-scattering artifacts from electron-energy-loss data is presented. In it, the mean free path of beam electrons in the sample is varied by changing their kinetic energy. Extrapolation of suitably normalized data to infinite mean free path produces the desired result. The method works for data gathered using any scattering angle, and over any energy-loss range, in which adequate counting rates are available.
| Original language | English |
|---|---|
| Pages (from-to) | 305-312 |
| Number of pages | 8 |
| Journal | Ultramicroscopy |
| Volume | 21 |
| Issue number | 4 |
| DOIs | |
| State | Published - 1987 |