TY - JOUR
T1 - High-Energy Collisions of Fullerene Radical Cations with Target Gases
T2 - Capture of the Target Gas and Charge Stripping of C60.+, C70.+, and C84.+
AU - Caldwell, Kenneth A.
AU - Giblin, Daryl E.
AU - Gross, Michael L.
PY - 1992/5/1
Y1 - 1992/5/1
N2 - This is a paper on the comprehensive study of the products formed when C60 and C70 radical cations undergo high-energy collisions with noble gases and with D2, N2, NO, or O2. A new design four-sector tandem mass spectrometer was used to prove that, as a result of collisions, small target gases are incorporated into intact fullerene radical cations. For helium target gas, the endohedral complexes C60He.+, C70He.+, and C84He.+ are produced directly from the radical cation precursor, and C60He2.+ is produced from C70.+ colliding with He. The molecular gas D2 also associates with C60.+ in a high-energy collision. The kinetic energies for product ions resulting from capture of a target gas are derived and compared with experimental values to probe the mechanism of formation of the He-containing and D2-containing fullerene product ions. The complex formed by capture of the He (or D2) fragments to produce the majority of the lower mass product ions, both those that contain and those that do not contain the target gas. The internal energy of these complexes was varied by changing the center-of-mass collision energy, which is entirely converted to internal energy of the complex when the target gas is captured. More extensive fragmentation occurs when neon is used as a target gas, and Ne-containing product ions are also observed. Collisions of C60.+ precursor ions with argon result in the formation of product ions corresponding formally to loss of odd-carbon fragments from C60Ar.+ to produce, for example, C55Ar.+. Collisions with the gases N2, NO, and O2 yield dramatically enhanced abundances of the doubly charged fullerene ions, thus facilitating the measurement of the second ionization energy by charge-stripping experiments. The work presented here builds on a preliminary communication1 of these results.
AB - This is a paper on the comprehensive study of the products formed when C60 and C70 radical cations undergo high-energy collisions with noble gases and with D2, N2, NO, or O2. A new design four-sector tandem mass spectrometer was used to prove that, as a result of collisions, small target gases are incorporated into intact fullerene radical cations. For helium target gas, the endohedral complexes C60He.+, C70He.+, and C84He.+ are produced directly from the radical cation precursor, and C60He2.+ is produced from C70.+ colliding with He. The molecular gas D2 also associates with C60.+ in a high-energy collision. The kinetic energies for product ions resulting from capture of a target gas are derived and compared with experimental values to probe the mechanism of formation of the He-containing and D2-containing fullerene product ions. The complex formed by capture of the He (or D2) fragments to produce the majority of the lower mass product ions, both those that contain and those that do not contain the target gas. The internal energy of these complexes was varied by changing the center-of-mass collision energy, which is entirely converted to internal energy of the complex when the target gas is captured. More extensive fragmentation occurs when neon is used as a target gas, and Ne-containing product ions are also observed. Collisions of C60.+ precursor ions with argon result in the formation of product ions corresponding formally to loss of odd-carbon fragments from C60Ar.+ to produce, for example, C55Ar.+. Collisions with the gases N2, NO, and O2 yield dramatically enhanced abundances of the doubly charged fullerene ions, thus facilitating the measurement of the second ionization energy by charge-stripping experiments. The work presented here builds on a preliminary communication1 of these results.
UR - http://www.scopus.com/inward/record.url?scp=0001546277&partnerID=8YFLogxK
U2 - 10.1021/ja00036a025
DO - 10.1021/ja00036a025
M3 - Article
AN - SCOPUS:0001546277
SN - 0002-7863
VL - 114
SP - 3743
EP - 3756
JO - Journal of the American Chemical Society
JF - Journal of the American Chemical Society
IS - 10
ER -