Frequency noise of a microchip raman laser

Tao Lu, Lan Yang, Tal Carmon, Bumki Min, Kerry Vahala

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We report measurement of the fundamental component of frequency noise in a micro-Raman laser fabricated on a silicon chip. A frequency noise spectral component that is equivalent to a Schawlow-Townes linewidth of 3-Hz is measured.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics, CLEO 2009
StatePublished - 2009
EventConference on Lasers and Electro-Optics, CLEO 2009 - Baltimore, MD, United States
Duration: May 31 2009Jun 5 2009

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceConference on Lasers and Electro-Optics, CLEO 2009
Country/TerritoryUnited States
CityBaltimore, MD
Period05/31/0906/5/09

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