TY - GEN
T1 - Expectation Versus Reality
T2 - 2020 IEEE Workshop Celebrating the Scientific Value of Failure, FailFest 2020
AU - Ha, Sunwoo
AU - Kern, Adam
AU - Bancilhon, Melanie
AU - Ottley, Alvitta
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/10
Y1 - 2020/10
N2 - Our research aimed to present the design and evaluation of a mixed-initiative system that aids the user in handling complex datasets and dense visualization systems. We attempted to demonstrate this system with two trials of an online between-groups, two-by-Two study, measuring the effects of this mixed-initiative system on user interactions and system usability. However, due to flaws in the interface design and the expectations that we put on users, we were unable to show that the adaptive system had an impact on user interactions or system usability. In this paper, we discuss the unexpected findings that we found from our 'failed' experiments and examine how we can learn from our failures to improve further research.
AB - Our research aimed to present the design and evaluation of a mixed-initiative system that aids the user in handling complex datasets and dense visualization systems. We attempted to demonstrate this system with two trials of an online between-groups, two-by-Two study, measuring the effects of this mixed-initiative system on user interactions and system usability. However, due to flaws in the interface design and the expectations that we put on users, we were unable to show that the adaptive system had an impact on user interactions or system usability. In this paper, we discuss the unexpected findings that we found from our 'failed' experiments and examine how we can learn from our failures to improve further research.
UR - http://www.scopus.com/inward/record.url?scp=85099590010&partnerID=8YFLogxK
U2 - 10.1109/FailFest51498.2020.00005
DO - 10.1109/FailFest51498.2020.00005
M3 - Conference contribution
AN - SCOPUS:85099590010
T3 - Proceedings - 2020 IEEE Workshop Celebrating the Scientific Value of Failure, FailFest 2020
SP - 1
EP - 5
BT - Proceedings - 2020 IEEE Workshop Celebrating the Scientific Value of Failure, FailFest 2020
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 25 October 2020
ER -