Exact Mass Measurement by Fourier Transform Mass Spectrometry

E. B. Ledford; Sahba Ghaderi; R. L. White; P. S. Kulkarni; C. L. Wilkins; M. L. Gross; R. B. Spencer

doi:10.1021/ac50053a021

Exact Mass Measurement by Fourier Transform Mass Spectrometry

E. B. Ledford, Sahba Ghaderi, R. L. White, P. S. Kulkarni, C. L. Wilkins, M. L. Gross, R. B. Spencer

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Abstract

Reported here for the first time is a technique utilizing Fourier Transform Mass Spectrometry (FT/MS) for determining elemental compositions of gas-phase ions by exact mass measurement. in contrast to previous literature reports of mass measurement errors averaging 77 ppm via ICR measurements, accuracies averaging 3 ppm have been achieved in the present work. Moreover, in the course of this study, the phenomenon of shifts in ion cyclotron resonance frequency with the number of ions in the cell has been investigated. The resonance shifts are caused by electric: fields associated with ion space charge. The consequences of this effect for mass measurement accuracy are discussed.

Original language	English
Pages (from-to)	463-468
Number of pages	6
Journal	Analytical Chemistry
Volume	52
Issue number	3
DOIs	https://doi.org/10.1021/ac50053a021
State	Published - Mar 1 1980

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title = "Exact Mass Measurement by Fourier Transform Mass Spectrometry",

abstract = "Reported here for the first time is a technique utilizing Fourier Transform Mass Spectrometry (FT/MS) for determining elemental compositions of gas-phase ions by exact mass measurement. in contrast to previous literature reports of mass measurement errors averaging 77 ppm via ICR measurements, accuracies averaging 3 ppm have been achieved in the present work. Moreover, in the course of this study, the phenomenon of shifts in ion cyclotron resonance frequency with the number of ions in the cell has been investigated. The resonance shifts are caused by electric: fields associated with ion space charge. The consequences of this effect for mass measurement accuracy are discussed.",

author = "Ledford, {E. B.} and Sahba Ghaderi and White, {R. L.} and Kulkarni, {P. S.} and Wilkins, {C. L.} and Gross, {M. L.} and Spencer, {R. B.}",

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AU - Ledford, E. B.

AU - Ghaderi, Sahba

AU - White, R. L.

AU - Kulkarni, P. S.

AU - Wilkins, C. L.

AU - Gross, M. L.

AU - Spencer, R. B.

PY - 1980/3/1

Y1 - 1980/3/1

N2 - Reported here for the first time is a technique utilizing Fourier Transform Mass Spectrometry (FT/MS) for determining elemental compositions of gas-phase ions by exact mass measurement. in contrast to previous literature reports of mass measurement errors averaging 77 ppm via ICR measurements, accuracies averaging 3 ppm have been achieved in the present work. Moreover, in the course of this study, the phenomenon of shifts in ion cyclotron resonance frequency with the number of ions in the cell has been investigated. The resonance shifts are caused by electric: fields associated with ion space charge. The consequences of this effect for mass measurement accuracy are discussed.

AB - Reported here for the first time is a technique utilizing Fourier Transform Mass Spectrometry (FT/MS) for determining elemental compositions of gas-phase ions by exact mass measurement. in contrast to previous literature reports of mass measurement errors averaging 77 ppm via ICR measurements, accuracies averaging 3 ppm have been achieved in the present work. Moreover, in the course of this study, the phenomenon of shifts in ion cyclotron resonance frequency with the number of ions in the cell has been investigated. The resonance shifts are caused by electric: fields associated with ion space charge. The consequences of this effect for mass measurement accuracy are discussed.

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EP - 468

JO - Analytical Chemistry

JF - Analytical Chemistry

IS - 3

ER -

Exact Mass Measurement by Fourier Transform Mass Spectrometry

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