Effect of perturbations in the geometry on the electroencephalography inverse problem

N. Von Ellenrieder, C. H. Muravchik, A. Nehorai

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

We study the effect of perturbations in the geometry of the head model on the accuracy of electroencephalography (EEG) source parameter estimation. These perturbations are small changes in the surfaces between layers of different electric conductivities used to model the head. We use a meshless method to solve the EEG forward problem. The method needs only a set of points on the surfaces to describe the model geometry. It allows a simple computation of the sensitivity of the estimation problem to the positions of these surface points. The effect of the perturbations on the measured electric potential is analyzed by means of the Cramer-Rao bound for the source parameter estimation.

Original languageEnglish
Title of host publicationProceedings of the 2003 IEEE Workshop on Statistical Signal Processing, SSP 2003
PublisherIEEE Computer Society
Pages286-289
Number of pages4
ISBN (Electronic)0780379977
DOIs
StatePublished - 2003
EventIEEE Workshop on Statistical Signal Processing, SSP 2003 - St. Louis, United States
Duration: Sep 28 2003Oct 1 2003

Publication series

NameIEEE Workshop on Statistical Signal Processing Proceedings
Volume2003-January

Conference

ConferenceIEEE Workshop on Statistical Signal Processing, SSP 2003
Country/TerritoryUnited States
CitySt. Louis
Period09/28/0310/1/03

Keywords

  • Brain modeling
  • Computer interfaces
  • Electric potential
  • Electric variables measurement
  • Electroencephalography
  • Geometry
  • Inverse problems
  • Magnetic heads
  • Parameter estimation
  • Solid modeling

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