TY - JOUR
T1 - Effect of head shape variations among individuals on the EEG/MEG forward and inverse problems
AU - Von Ellenrieder, Nicolás
AU - Muravchik, Carlos H.
AU - Wagner, Michael
AU - Nehorai, Arye
N1 - Funding Information:
Manuscript received February 13, 2008; revised May 14, 2008 and September 18, 2008. First published October 31, 2008; current version published April 15, 2009. The work of N. von Ellenrieder and C. H. Muravchik was supported by the Universidad Nacional de La Plata (UNLP), by the Consejo Na-cional de Investigaciones Científicas y Técnicas (CONICET), by the Comisión de Investigaciones Científicas de la Provincia de Buenos Aires (CICpBA), and by the Agencia Nacional de Promoción Científica y Tecnológica (ANPCyT) under Grant PICT 11-14111. Asterisk indicates corresponding author.
PY - 2009/3
Y1 - 2009/3
N2 - We study the effect of the head shape variations on the EEG/magnetoencephalography (MEG) forward and inverse problems. We build a random head model such that each sample represents the head shape of a different individual and solve the forward problem assuming this random head model, using a polynomial chaos expansion. The random solution of the forward problem is then used to quantify the effect of the geometry when the inverse problem is solved with a standard head model. The results derived with this approach are valid for a continuous family of head models, rather than just for a set of cases. The random model consists of three random surfaces that define layers of different electric conductivity, and we built an example based on a set of 30 deterministic models from adults. Our results show that for a dipolar source model, the effect of the head shape variations on the EEG/MEG inverse problem due to the random head model is slightly larger than the effect of the electronic noise present in the sensors. The variations in the EEG inverse problem solutions are due to the variations in the shape of the volume conductor, while the variations in the MEG inverse problem solutions, larger than the EEG ones, are caused mainly by the variations of the absolute position of the sources in a coordinate system based on anatomical landmarks, in which the magnetometers have a fixed position.
AB - We study the effect of the head shape variations on the EEG/magnetoencephalography (MEG) forward and inverse problems. We build a random head model such that each sample represents the head shape of a different individual and solve the forward problem assuming this random head model, using a polynomial chaos expansion. The random solution of the forward problem is then used to quantify the effect of the geometry when the inverse problem is solved with a standard head model. The results derived with this approach are valid for a continuous family of head models, rather than just for a set of cases. The random model consists of three random surfaces that define layers of different electric conductivity, and we built an example based on a set of 30 deterministic models from adults. Our results show that for a dipolar source model, the effect of the head shape variations on the EEG/MEG inverse problem due to the random head model is slightly larger than the effect of the electronic noise present in the sensors. The variations in the EEG inverse problem solutions are due to the variations in the shape of the volume conductor, while the variations in the MEG inverse problem solutions, larger than the EEG ones, are caused mainly by the variations of the absolute position of the sources in a coordinate system based on anatomical landmarks, in which the magnetometers have a fixed position.
KW - EEG/magnetoencephalography (MEG) average head model
KW - Polynomial chaos expansion (PCE)
KW - Sparse grids
KW - Stochastic modeling
UR - https://www.scopus.com/pages/publications/65349133052
U2 - 10.1109/TBME.2009.2008445
DO - 10.1109/TBME.2009.2008445
M3 - Article
C2 - 19389682
AN - SCOPUS:65349133052
SN - 0018-9294
VL - 56
SP - 587
EP - 597
JO - IEEE Transactions on Biomedical Engineering
JF - IEEE Transactions on Biomedical Engineering
IS - 3
M1 - 4838933
ER -