EEG-based Neglect Detection for Stroke Patients

  • Deniz Kocanaogullari
  • , Jennifer Mak
  • , Jessica Kersey
  • , Aya Khalaf
  • , Sarah Ostadabbas
  • , George Wittenberg
  • , Elizabeth Skidmore
  • , Murat Akcakaya

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

8 Scopus citations

Abstract

Spatial neglect (SN) is a neurological syndrome in stroke patients, commonly due to unilateral brain injury. It results in inattention to stimuli in the contralesional visual field. The current gold standard for SN assessment is the behavioral inattention test (BIT). BIT includes a series of penand-paper tests. These tests can be unreliable due to high variablility in subtest performances; they are limited in their ability to measure the extent of neglect, and they do not assess the patients in a realistic and dynamic environment. In this paper, we present an electroencephalography (EEG)-based brain-computer interface (BCI) that utilizes the Starry Night Test to overcome the limitations of the traditional SN assessment tests. Our overall goal with the implementation of this EEG-based Starry Night neglect detection system is to provide a more detailed assessment of SN. Specifically, to detect the presence of SN and its severity. To achieve this goal, as an initial step, we utilize a convolutional neural network (CNN) based model to analyze EEG data and accordingly propose a neglect detection method to distinguish between stroke patients without neglect and stroke patients with neglect.Clinical relevance - The proposed EEG-based BCI can be used to detect neglect in stroke patients with high accuracy, specificity and sensitivity. Further research will additionally allow for an estimation of a patient's field of view (FOV) for more detailed assessment of neglect.

Original languageEnglish
Title of host publication42nd Annual International Conferences of the IEEE Engineering in Medicine and Biology Society
Subtitle of host publicationEnabling Innovative Technologies for Global Healthcare, EMBC 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages264-267
Number of pages4
ISBN (Electronic)9781728119908
DOIs
StatePublished - Jul 2020
Event42nd Annual International Conferences of the IEEE Engineering in Medicine and Biology Society, EMBC 2020 - Montreal, Canada
Duration: Jul 20 2020Jul 24 2020

Publication series

NameProceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS
Volume2020-July
ISSN (Print)1557-170X

Conference

Conference42nd Annual International Conferences of the IEEE Engineering in Medicine and Biology Society, EMBC 2020
Country/TerritoryCanada
CityMontreal
Period07/20/2007/24/20

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