TY - GEN
T1 - Discrete-time fractional-order multiple scenario-based sensor selection
AU - Pequito, Sergio
AU - Clark, Andrew
AU - Pappas, George J.
N1 - Publisher Copyright:
© 2017 American Automatic Control Council (AACC).
PY - 2017/6/29
Y1 - 2017/6/29
N2 - In this paper, we address the problem of deploying sensors to estimate the state of a plant described by discrete-time fractional-order system. More specifically, we assume that these systems' parameters and disturbance/measurement noise characteristics describe possible scenarios. Therefore, the goal of this paper is that of selecting a subset of sensors that will optimally perform (in a minimum squared error sense) among multiple (finite) scenarios. In particular, we show this problem to be NP-hard, and we provide a bisection-type algorithm with suboptimality guarantees. Furthermore, we show that no other algorithm ensures better optimality bound for this problem unless P=NP. Finally, we present some simulations that illustrate the applicability of the main results in an electroencephalogram data associated with different tasks.
AB - In this paper, we address the problem of deploying sensors to estimate the state of a plant described by discrete-time fractional-order system. More specifically, we assume that these systems' parameters and disturbance/measurement noise characteristics describe possible scenarios. Therefore, the goal of this paper is that of selecting a subset of sensors that will optimally perform (in a minimum squared error sense) among multiple (finite) scenarios. In particular, we show this problem to be NP-hard, and we provide a bisection-type algorithm with suboptimality guarantees. Furthermore, we show that no other algorithm ensures better optimality bound for this problem unless P=NP. Finally, we present some simulations that illustrate the applicability of the main results in an electroencephalogram data associated with different tasks.
UR - https://www.scopus.com/pages/publications/85027038954
U2 - 10.23919/ACC.2017.7963808
DO - 10.23919/ACC.2017.7963808
M3 - Conference contribution
AN - SCOPUS:85027038954
T3 - Proceedings of the American Control Conference
SP - 5488
EP - 5493
BT - 2017 American Control Conference, ACC 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2017 American Control Conference, ACC 2017
Y2 - 24 May 2017 through 26 May 2017
ER -