TY - JOUR
T1 - Deconvolution methods for 3-D fluorescence microscopy images
AU - Sarder, Pinaki
AU - Nehorai, Arye
N1 - Funding Information:
We are grateful to Prof. David Kelso and John Ketterson of Northwestern University, as well as Prof. Alan Feinerman of the University of Illinois at Chicago, for providing the images in Figures 1 and 8. This work was supported by NSF Grant CCR-0330342.
PY - 2006/5
Y1 - 2006/5
N2 - A fluorescence microscope is a light microscope used to study properties of organic or inorganic substances using the phenomenon of fluorescence and phosphorescence instead of, or in addition to, reflection and absorption. These microscopes can be categorized into two major groups: the widefield microscope and the confocal microscope. In both microscope groups, imaging properties and measurement imperfections distort the original 3-D image and reduce the maximal resolution obtainable by the imaging system. The most severe distortion in the acquired 3-D image is often due to point-spread function (PSF). Fortunately, several 3-D image deconvolution techniques are already available and these fall into six broad classes: no-neighbors methods, neighboring methods, linear methods, nonlinear methods, statistical methods, and blind deconvolution methods.
AB - A fluorescence microscope is a light microscope used to study properties of organic or inorganic substances using the phenomenon of fluorescence and phosphorescence instead of, or in addition to, reflection and absorption. These microscopes can be categorized into two major groups: the widefield microscope and the confocal microscope. In both microscope groups, imaging properties and measurement imperfections distort the original 3-D image and reduce the maximal resolution obtainable by the imaging system. The most severe distortion in the acquired 3-D image is often due to point-spread function (PSF). Fortunately, several 3-D image deconvolution techniques are already available and these fall into six broad classes: no-neighbors methods, neighboring methods, linear methods, nonlinear methods, statistical methods, and blind deconvolution methods.
UR - http://www.scopus.com/inward/record.url?scp=85032750912&partnerID=8YFLogxK
U2 - 10.1109/MSP.2006.1628876
DO - 10.1109/MSP.2006.1628876
M3 - Review article
AN - SCOPUS:85032750912
SN - 1053-5888
VL - 23
SP - 32
EP - 45
JO - IEEE Signal Processing Magazine
JF - IEEE Signal Processing Magazine
IS - 3
ER -