TY - GEN
T1 - Bias-scalable inner-product approximation circuit using analog margin propagation
AU - Gu, Ming
AU - Chakrabartty, Shantanu
PY - 2013
Y1 - 2013
N2 - Bias-scalability is a property of an analog CMOS circuit where its functional response remains invariant with respect to the MOSFET's biasing condition, namely weak-inversion, moderate-inversion and strong-inversion. As a result bias-scalable circuits can seamlessly operate over a wide operating range without the need for re-biasing, re-design or re-calibration. In this paper, we present the design of a bias-scalable analog circuit that computes an inner-product between two vectors. At the core of the proposed design is a margin-propagation based piece-wise approximation technique that relies only on universal conservation principles (like KCL and thresholding) to achieve bias-scalability. The concept is validated using measured results from prototypes fabricated in a 0.5μm standard CMOS process.
AB - Bias-scalability is a property of an analog CMOS circuit where its functional response remains invariant with respect to the MOSFET's biasing condition, namely weak-inversion, moderate-inversion and strong-inversion. As a result bias-scalable circuits can seamlessly operate over a wide operating range without the need for re-biasing, re-design or re-calibration. In this paper, we present the design of a bias-scalable analog circuit that computes an inner-product between two vectors. At the core of the proposed design is a margin-propagation based piece-wise approximation technique that relies only on universal conservation principles (like KCL and thresholding) to achieve bias-scalability. The concept is validated using measured results from prototypes fabricated in a 0.5μm standard CMOS process.
UR - http://www.scopus.com/inward/record.url?scp=84893198305&partnerID=8YFLogxK
U2 - 10.1109/MWSCAS.2013.6674701
DO - 10.1109/MWSCAS.2013.6674701
M3 - Conference contribution
AN - SCOPUS:84893198305
SN - 9781479900664
T3 - Midwest Symposium on Circuits and Systems
SP - 525
EP - 528
BT - 2013 IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013
T2 - 2013 IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013
Y2 - 4 August 2013 through 7 August 2013
ER -