Atomic resolution STEM-EELS studies of defects and local structural distortions in oxide interfaces

G. Sánchez-Santolino; M. A. Roldan; Qiao Qiao; L. Begon-Lours; M. A. Frechero; J. Salafranca; R. Mishra; C. Leon; S. T. Pantelides; S. J. Pennycook; J. E. Villegas; J. Santamaria; M. Varela

doi:10.1017/S1431927617002549

Atomic resolution STEM-EELS studies of defects and local structural distortions in oxide interfaces

G. Sánchez-Santolino
, M. A. Roldan
, Qiao Qiao
, L. Begon-Lours
, M. A. Frechero
, J. Salafranca
, R. Mishra
, C. Leon
, S. T. Pantelides
, S. J. Pennycook
, J. E. Villegas
, J. Santamaria
, M. Varela

Research output: Contribution to journal › Comment/debate

Original language	English
Pages (from-to)	372-373
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	23
DOIs	https://doi.org/10.1017/S1431927617002549
State	Published - 2017

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10.1017/S1431927617002549

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Sánchez-Santolino, G., Roldan, M. A., Qiao, Q., Begon-Lours, L., Frechero, M. A., Salafranca, J., Mishra, R., Leon, C., Pantelides, S. T., Pennycook, S. J., Villegas, J. E., Santamaria, J., & Varela, M. (2017). Atomic resolution STEM-EELS studies of defects and local structural distortions in oxide interfaces. Microscopy and Microanalysis, 23, 372-373. https://doi.org/10.1017/S1431927617002549

@article{eb0a755f511c44999c44fe83c13bac8a,

title = "Atomic resolution STEM-EELS studies of defects and local structural distortions in oxide interfaces",

author = "G. S{\'a}nchez-Santolino and Roldan, \{M. A.\} and Qiao Qiao and L. Begon-Lours and Frechero, \{M. A.\} and J. Salafranca and R. Mishra and C. Leon and Pantelides, \{S. T.\} and Pennycook, \{S. J.\} and Villegas, \{J. E.\} and J. Santamaria and M. Varela",

year = "2017",

doi = "10.1017/S1431927617002549",

language = "English",

volume = "23",

pages = "372--373",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

}

Sánchez-Santolino, G, Roldan, MA, Qiao, Q, Begon-Lours, L, Frechero, MA, Salafranca, J, Mishra, R, Leon, C, Pantelides, ST, Pennycook, SJ, Villegas, JE, Santamaria, J & Varela, M 2017, 'Atomic resolution STEM-EELS studies of defects and local structural distortions in oxide interfaces', Microscopy and Microanalysis, vol. 23, pp. 372-373. https://doi.org/10.1017/S1431927617002549

TY - JOUR

T1 - Atomic resolution STEM-EELS studies of defects and local structural distortions in oxide interfaces

AU - Sánchez-Santolino, G.

AU - Roldan, M. A.

AU - Qiao, Qiao

AU - Begon-Lours, L.

AU - Frechero, M. A.

AU - Salafranca, J.

AU - Mishra, R.

AU - Leon, C.

AU - Pantelides, S. T.

AU - Pennycook, S. J.

AU - Villegas, J. E.

AU - Santamaria, J.

AU - Varela, M.

PY - 2017

Y1 - 2017

UR - https://www.scopus.com/pages/publications/85041006573

U2 - 10.1017/S1431927617002549

DO - 10.1017/S1431927617002549

M3 - Comment/debate

AN - SCOPUS:85041006573

SN - 1431-9276

VL - 23

SP - 372

EP - 373

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -

Atomic resolution STEM-EELS studies of defects and local structural distortions in oxide interfaces

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