Abstract
In this study, the unique ability of AFM to visualize the nanoscale surface topography and to provide relative viscoelastic properties of the surface and immediate subsurface has been exploited. Lenses made from poly (methyl methacrylate) and polysiloxane derivatives were used. Throughout the study, etched silicon probes and J-type piezoelectric scanner were used.
| Original language | English |
|---|---|
| Pages (from-to) | 128-129 |
| Number of pages | 2 |
| Journal | Polymeric Materials Science and Engineering, Proceedings of the ACS Division of Polymeric Materials Science and Engineering |
| Volume | 76 |
| State | Published - Jan 1 1997 |
| Event | Proceedings of the 1997 Spring ACS Meeting - San Francisco, CA, USA Duration: Apr 13 1997 → Apr 17 1997 |