Approaching the limits of piezoelectricity driven hot-electron injection for self-powered in vivo monitoring of micro-strain variations

Liang Zhou, Adam C. Abraham, Simon Y. Tang, Shantanu Chakrabartty

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper we explore the limits of self-powering a piezoelectricity driven hot-electron injection (p-HEI) device used for monitoring mechanical activity in biomechanical implants and structures. Previously reported p-HEI devices operate by harvesting energy from a piezoelectric transducer to generate current an voltage references which are then used for initiating and controlling the process of hot-electron injection. As a result, the minimum energy required to activate the device is limited by the power requirements of the reference circuits. The p-HEI device presented in this paper operates by directly exploiting the self-limiting capability of an energy transducer when driving the process of hot-electron injection in a pMOS floating-gate transistor. As a result we show that the p-HEI device can activate itself at input power levels less than 10 nW. Using a prototype fabricated in a 0.5-μm bulk CMOS process we validate the functionality of the proposed injector and show that for a fixed input power, its dynamics is quasi-linear with respect to time. The paper also presents measurement results using a cadaver bone where the fabricated p-HEI device has been integrated with a piezoelectric transducer and is used for self-powered monitoring of mechanical activity.

Original languageEnglish
Title of host publicationISCAS 2016 - IEEE International Symposium on Circuits and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1810-1813
Number of pages4
ISBN (Electronic)9781479953400
DOIs
StatePublished - Jul 29 2016
Event2016 IEEE International Symposium on Circuits and Systems, ISCAS 2016 - Montreal, Canada
Duration: May 22 2016May 25 2016

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
Volume2016-July
ISSN (Print)0271-4310

Conference

Conference2016 IEEE International Symposium on Circuits and Systems, ISCAS 2016
Country/TerritoryCanada
CityMontreal
Period05/22/1605/25/16

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