Abstract
A new apparatus for making in-situ measurements of changes in the electrical resistivity accompanying phase transformations and structural relaxation of rapidly quenched metallic alloys is presented. Measurements may be made in vacuum or inert gas. In inert gas, the sample temperature is raised to the annealing temperature within 3-4 min with no appreciable overshoot; the long-term thermal stability is better than ±0.2 K. The measurement circuit is stable to better than 5 ppm over 24 h. The apparatus is simple, convenient to use, and flexible for changes in the experimental design.
| Original language | English |
|---|---|
| Pages (from-to) | 347-350 |
| Number of pages | 4 |
| Journal | Review of Scientific Instruments |
| Volume | 59 |
| Issue number | 2 |
| DOIs | |
| State | Published - 1988 |