Alumina atomic layer deposition nanocoatings on primary diamond particles using a fluidized bed reactor

  • Xinhua Liang
  • , Guo Dong Zhan
  • , David M. King
  • , Jarod A. McCormick
  • , John Zhang
  • , Steven M. George
  • , Alan W. Weimer

Research output: Contribution to journalArticlepeer-review

43 Scopus citations

Abstract

Ultra-thin alumina films are successfully deposited on primary micron-sized diamond particles in a scalable fluidized bed reactor. The studies of fluidization at reduced pressure show that micron-sized diamond particles can be fluidized with the assistance of vibration. Alumina films are grown at 177 °C by atomic layer deposition (ALD) using sequential exposures of Al(CH3)3 and H2O. The deposited alumina films are characterized by X-ray photoelectron spectroscopy, transmission and scanning electron microscopy, inductively coupled plasma-atomic emission spectroscopy, and surface area. The results indicate that the alumina films are conformally coated on the primary diamond particle surface, and the growth rate of alumina is 0.12 nm per coating cycle.

Original languageEnglish
Pages (from-to)185-189
Number of pages5
JournalDiamond and Related Materials
Volume17
Issue number2
DOIs
StatePublished - Feb 2008

Keywords

  • Alumina film
  • Atomic layer deposition (ALD)
  • Fluidized bed reactor

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