Alternating minimization algorithm for dual energy X-ray CT

Joseph A. O'Sullivan, Jasenka Benac, Jeffrey F. Williamson

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

13 Scopus citations

Abstract

We present a method for obtaining quantitative images from dual energy X-ray CT measurements. We adopt a statistical model for the data and reconstruct images by maximizing the log-likelihood via an alternating minimization (AM) algorithm. Results for simulated data are shown and are compared to a post-processing method.

Original languageEnglish
Title of host publication2004 2nd IEEE International Symposium on Biomedical Imaging
Subtitle of host publicationMacro to Nano
Pages579-582
Number of pages4
StatePublished - Dec 1 2004
Event2004 2nd IEEE International Symposium on Biomedical Imaging: Macro to Nano - Arlington, VA, United States
Duration: Apr 15 2004Apr 18 2004

Publication series

Name2004 2nd IEEE International Symposium on Biomedical Imaging: Macro to Nano
Volume1

Conference

Conference2004 2nd IEEE International Symposium on Biomedical Imaging: Macro to Nano
Country/TerritoryUnited States
CityArlington, VA
Period04/15/0404/18/04

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