Advantages of helium and neon ion beams for intelligent imaging

Huimeng Wu; Shawn McVey; David Ferranti; Chuong Huynh; John Notte; Lewis Stern; Matthew S. Joens; James A.J. Fitzpatrick; Bernhard Goetze

doi:10.1017/S1431927614003419

Advantages of helium and neon ion beams for intelligent imaging

Huimeng Wu
, Shawn McVey
, David Ferranti
, Chuong Huynh
, John Notte
, Lewis Stern
, Matthew S. Joens
, James A.J. Fitzpatrick
, Bernhard Goetze

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	338-339
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614003419
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

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@article{f8e0272f03284414b4b4ca085048901c,

title = "Advantages of helium and neon ion beams for intelligent imaging",

author = "Huimeng Wu and Shawn McVey and David Ferranti and Chuong Huynh and John Notte and Lewis Stern and Joens, \{Matthew S.\} and Fitzpatrick, \{James A.J.\} and Bernhard Goetze",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614003419",

language = "English",

volume = "20",

pages = "338--339",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

}

TY - JOUR

T1 - Advantages of helium and neon ion beams for intelligent imaging

AU - Wu, Huimeng

AU - McVey, Shawn

AU - Ferranti, David

AU - Huynh, Chuong

AU - Notte, John

AU - Stern, Lewis

AU - Joens, Matthew S.

AU - Fitzpatrick, James A.J.

AU - Goetze, Bernhard

PY - 2014/8/1

Y1 - 2014/8/1

UR - https://www.scopus.com/pages/publications/84927919079

U2 - 10.1017/S1431927614003419

DO - 10.1017/S1431927614003419

M3 - Conference article

AN - SCOPUS:84927919079

SN - 1431-9276

VL - 20

SP - 338

EP - 339

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Advantages of helium and neon ion beams for intelligent imaging

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