Advantages of helium and neon ion beams for intelligent imaging

Huimeng Wu, Shawn McVey, David Ferranti, Chuong Huynh, John Notte, Lewis Stern, Matthew S. Joens, James A.J. Fitzpatrick, Bernhard Goetze

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations
Original languageEnglish
Pages (from-to)338-339
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014
Externally publishedYes
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: Aug 3 2014Aug 7 2014

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