Advantages of helium and neon ion beams for intelligent imaging

Huimeng Wu; Shawn McVey; David Ferranti; Chuong Huynh; John Notte; Lewis Stern; Matthew S. Joens; James A.J. Fitzpatrick; Bernhard Goetze

doi:10.1017/S1431927614003419

Advantages of helium and neon ion beams for intelligent imaging

Huimeng Wu, Shawn McVey, David Ferranti, Chuong Huynh, John Notte, Lewis Stern, Matthew S. Joens, James A.J. Fitzpatrick, Bernhard Goetze

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Original language	English
Pages (from-to)	338-339
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614003419
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

Access to Document

10.1017/S1431927614003419

Cite this

@article{f8e0272f03284414b4b4ca085048901c,

title = "Advantages of helium and neon ion beams for intelligent imaging",

author = "Huimeng Wu and Shawn McVey and David Ferranti and Chuong Huynh and John Notte and Lewis Stern and Joens, {Matthew S.} and Fitzpatrick, {James A.J.} and Bernhard Goetze",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614003419",

language = "English",

volume = "20",

pages = "338--339",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

number = "3",

note = "null ; Conference date: 03-08-2014 Through 07-08-2014",

}

TY - JOUR

T1 - Advantages of helium and neon ion beams for intelligent imaging

AU - Wu, Huimeng

AU - McVey, Shawn

AU - Ferranti, David

AU - Huynh, Chuong

AU - Notte, John

AU - Stern, Lewis

AU - Joens, Matthew S.

AU - Fitzpatrick, James A.J.

AU - Goetze, Bernhard

PY - 2014/8/1

Y1 - 2014/8/1

UR - http://www.scopus.com/inward/record.url?scp=84927919079&partnerID=8YFLogxK

U2 - 10.1017/S1431927614003419

DO - 10.1017/S1431927614003419

M3 - Conference article

AN - SCOPUS:84927919079

SN - 1431-9276

VL - 20

SP - 338

EP - 339

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

Y2 - 3 August 2014 through 7 August 2014

ER -

Advantages of helium and neon ion beams for intelligent imaging

Access to Document

Other files and links

Cite this