Original language | English |
---|---|
Pages (from-to) | 338-339 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 20 |
Issue number | 3 |
DOIs | |
State | Published - Aug 1 2014 |
Event | Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014 |
Advantages of helium and neon ion beams for intelligent imaging
Huimeng Wu, Shawn McVey, David Ferranti, Chuong Huynh, John Notte, Lewis Stern, Matthew S. Joens, James A.J. Fitzpatrick, Bernhard Goetze
Research output: Contribution to journal › Conference article › peer-review
1
Scopus
citations